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XC3S100E-4VQG100CS1 参数 Datasheet PDF下载

XC3S100E-4VQG100CS1图片预览
型号: XC3S100E-4VQG100CS1
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 572MHz, 2160-Cell, CMOS, PQFP100,]
分类和应用: 时钟可编程逻辑
文件页数/大小: 227 页 / 6528 K
品牌: XILINX [ XILINX, INC ]
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Spartan-3E FPGA Family: DC and Switching Characteristics  
Simultaneously Switching Output Guidelines  
This section provides guidelines for the recommended  
maximum allowable number of Simultaneous Switching  
Outputs (SSOs). These guidelines describe the maximum  
number of user I/O pins of a given output signal standard  
that should simultaneously switch in the same direction,  
while maintaining a safe level of switching noise. Meeting  
these guidelines for the stated test conditions ensures that  
the FPGA operates free from the adverse effects of ground  
and power bounce.  
equivalent number of pairs is based on characterization and  
might not match the physical number of pairs. For each  
output signal standard and drive strength, Table 97  
recommends the maximum number of SSOs, switching in  
the same direction, allowed per V  
/GND pair within an  
CCO  
I/O bank. The guidelines in Table 97 are categorized by  
package style. Multiply the appropriate numbers from  
Table 96 and Table 97 to calculate the maximum number of  
SSOs allowed within an I/O bank. Exceeding these SSO  
guidelines might result in increased power or ground  
bounce, degraded signal integrity, or increased system jitter.  
Ground or power bounce occurs when a large number of  
outputs simultaneously switch in the same direction. The  
output drive transistors all conduct current to a common  
SSO  
/IO Bank = Table 96 x Table 97  
MAX  
voltage rail. Low-to-High transitions conduct to the V  
CCO  
The recommended maximum SSO values assumes that the  
FPGA is soldered on the printed circuit board and that the  
board uses sound design practices. The SSO values do not  
apply for FPGAs mounted in sockets, due to the lead  
inductance introduced by the socket.  
rail; High-to-Low transitions conduct to the GND rail. The  
resulting cumulative current transient induces a voltage  
difference across the inductance that exists between the die  
pad and the power supply or ground return. The inductance  
is associated with bonding wires, the package lead frame,  
and any other signal routing inside the package. Other  
variables contribute to SSO noise levels, including stray  
inductance on the PCB as well as capacitive loading at  
receivers. Any SSO-induced voltage consequently affects  
internal switching noise margins and ultimately signal  
quality.  
The number of SSOs allowed for quad-flat packages (VQ,  
TQ, PQ) is lower than for ball grid array packages (FG) due  
to the larger lead inductance of the quad-flat packages. The  
results for chip-scale packaging (CP132) are better than  
quad-flat packaging but not as high as for ball grid array  
packaging. Ball grid array packages are recommended for  
applications with a large number of simultaneously  
switching outputs.  
Table 96 and Table 97 provide the essential SSO  
guidelines. For each device/package combination, Table 96  
provides the number of equivalent V  
/GND pairs. The  
CCO  
Table 96: Equivalent V  
/GND Pairs per Bank  
CCO  
Package Style (including Pb-free)  
Device  
VQ100  
CP132  
TQ144  
PQ208  
FT256  
FG320  
FG400  
FG484  
XC3S100E  
XC3S250E  
XC3S500E  
XC3S1200E  
XC3S1600E  
2
2
2
-
2
2
2
-
2
2
-
-
3
3
-
-
4
4
4
-
-
-
-
-
-
-
5
5
5
-
-
-
6
6
-
-
-
-
-
7
DS312 (v4.2) December 14, 2018  
www.xilinx.com  
Product Specification  
134  
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