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XC3S100E-4VQG100CS1 参数 Datasheet PDF下载

XC3S100E-4VQG100CS1图片预览
型号: XC3S100E-4VQG100CS1
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 572MHz, 2160-Cell, CMOS, PQFP100,]
分类和应用: 时钟可编程逻辑
文件页数/大小: 227 页 / 6528 K
品牌: XILINX [ XILINX, INC ]
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Spartan-3E FPGA Family: DC and Switching Characteristics  
Table 95: Test Methods for Timing Measurement at I/Os (Cont’d)  
Inputs and  
Outputs  
Inputs  
Outputs  
Signal Standard  
(IOSTANDARD)  
VREF (V)  
VL (V)  
VH (V)  
RT (Ω)  
50  
VT (V)  
0.9  
VM (V)  
VICM  
VICM  
VICM  
VICM  
DIFF_HSTL_I_18  
-
-
-
-
VREF – 0.5  
VREF – 0.5  
VREF – 0.5  
VREF – 0.5  
VREF + 0.5  
VREF + 0.5  
VREF + 0.5  
VREF + 0.5  
DIFF_HSTL_III_18  
DIFF_SSTL18_I  
DIFF_SSTL2_I  
50  
1.8  
50  
0.9  
50  
1.25  
Notes:  
1. Descriptions of the relevant symbols are as follows:  
V
V
V
– The reference voltage for setting the input switching threshold  
– The common mode input voltage  
– Voltage of measurement point on signal transition  
REF  
ICM  
M
V – Low-level test voltage at Input pin  
L
V
– High-level test voltage at Input pin  
H
R – Effective termination resistance, which takes on a value of 1MΩ when no parallel termination is required  
T
V – Termination voltage  
T
2. The load capacitance (C ) at the Output pin is 0 pF for all signal standards.  
L
3. According to the PCI specification.  
The capacitive load (C ) is connected between the output  
and GND. The Output timing for all standards, as published  
Delays for a given application are simulated according to its  
specific load conditions as follows:  
L
in the speed files and the data sheet, is always based on a  
1. Simulate the desired signal standard with the output  
driver connected to the test setup shown in Figure 72.  
C value of zero. High-impedance probes (less than 1 pF)  
L
are used for all measurements. Any delay that the test  
fixture might contribute to test measurements is subtracted  
from those measurements to produce the final timing  
numbers as published in the speed files and data sheet.  
Use parameter values V , R , and V from Table 95.  
T
T
M
C
is zero.  
REF  
2. Record the time to V .  
M
3. Simulate the same signal standard with the output  
driver connected to the PCB trace with load. Use the  
Using IBIS Models to Simulate Load  
Conditions in Application  
appropriate IBIS model (including V  
, R  
, C  
,
REF  
REF  
REF  
and V  
load.  
values) or capacitive value to represent the  
MEAS  
IBIS models permit the most accurate prediction of timing  
delays for a given application. The parameters found in the  
4. Record the time to V  
.
MEAS  
IBIS model (V  
, R  
, and V  
) correspond directly  
REF  
REF  
MEAS  
5. Compare the results of steps 2 and 4. Add (or subtract)  
the increase (or decrease) in delay to (or from) the  
appropriate Output standard adjustment (Table 94) to  
yield the worst-case delay of the PCB trace.  
with the parameters used in Table 95 (V , R , and V ). Do  
T
T
M
not confuse V  
(the termination voltage) from the IBIS  
REF  
model with V  
(the input-switching threshold) from the  
REF  
table. A fourth parameter, C  
, is always zero. The four  
REF  
parameters describe all relevant output test conditions. IBIS  
models are found in the Xilinx development software as well  
as at the following link:  
http://www.xilinx.com/support/download/index.htm  
DS312 (v4.2) December 14, 2018  
www.xilinx.com  
Product Specification  
133  
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