VSC6134
Datasheet
4.3
Operating Conditions
The following table shows the recommended operating conditions for the VSC6134 device.
Table 450. Recommended Operating Conditions
Symbol
Parameter
Minimum
1.14
Typical
1.20
Maximum
Unit
V
VDDCORE
Core supply voltage
LVDS I/O external supply voltage
1.26
VDDIOTX0
VDDIORX1
VDDIOTX0
VDDIORX1
,
,
,
2.375
2.5
2.625
V
VDDIOTTL1
,
LVTTL I/O external supply voltage(1) 2.5 V mode
2.375
3.135
2.5
3.3
2.625
3.465
V
V
VDDIOTTL2 LVTTL I/O external supply voltage 3.3 V mode
IDD
Core supply current
1.83
0.92
1.97
1.1
0.1
85
A
A
IDDH
IDDTTL
T
I/O supply current
LVTTL I/O supply current
Operating temperature(2)
0.048
A
0
oC
1. LVTTL I/O may operate at either 2.5 V or 3.3 V power supply. The 3.3 V supply must be used to enable LVTTL receiver
compatibility with the 3.3 V LVTTL driver devices.
2. Lower limit of specification is ambient temperature, and upper limit is case temperature.
4.4
Stress Ratings
This section contains the stress ratings for the VSC6134 device.
Warning Stresses listed in the following table may be applied to devices one at a time without causing
permanent damage. Functionality at or exceeding the values listed is not implied. Exposure to these
values for extended periods may affect device reliability.
Table 451. Absolute Maximum Ratings
Symbol
Parameter
Minimum
–0.5
Maximum
1.32
Unit
V
VDDCORE
Core supply voltage
LVDS I/O external supply voltage
VDDIOTX0
VDDIORX1
VDDIOTX0
VDDIORX1
,
,
,
–0.5
2.875
V
VDDIOTTL1
,
LVTTL I/O external supply voltage(1) 2.5 V mode
–0.5
3.80
V
VDDIOTTL2 LVTTL I/O external supply voltage 3.3 V mode
TS Storage temperature
–65
150
oC
V
VESD_CDM Electrostatic discharge voltage, charged device
model
–1000
1000
VESD_HBM Electrostatic discharge voltage, human body
model
–1500
1500
V
1. LVTTL I/O may operate at either 2.5 V or 3.3 V power supply. The 3.3 V supply must be used to enable
LVTTL receiver compatibility with the 3.3 V LVTTL driver devices.
Warning This device can be damaged by electrostatic discharge (ESD) voltage. Vitesse recommends
that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling
and installation procedures may adversely affect reliability of the device.
405 of 438
VMDS-10185 Revision 4.0
July 2006
VITESSE [ VITESSE SEMICONDUCTOR CORPORATION ]
