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EP20K200RC208-1 参数 Datasheet PDF下载

EP20K200RC208-1图片预览
型号: EP20K200RC208-1
PDF下载: 下载PDF文件 查看货源
内容描述: 现场可编程门阵列(FPGA)的\n [Field Programmable Gate Array (FPGA) ]
分类和应用: 现场可编程门阵列
文件页数/大小: 114 页 / 1501 K
品牌: ETC [ ETC ]
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APEX 20K Programmable Logic Device Family Data Sheet  
APEX 20K devices include device enhancements to support the SignalTap  
embedded logic analyzer. By including this circuitry, the APEX 20K  
device provides the ability to monitor design operation over a period of  
time through the IEEE Std. 1149.1 (JTAG) circuitry; a designer can analyze  
internal logic at speed without bringing internal signals to the I/ O pins.  
This feature is particularly important for advanced packages such as  
FineLine BGA packages because adding a connection to a pin during the  
debugging process can be difficult after a board is designed and  
manufactured.  
SignalTap  
Embedded  
Logic Analyzer  
All APEX 20K devices provide JTAG BST circuitry that complies with the  
IEEE Std. 1149.1-1990 specification. The EP20K1500E device supports the  
JTAG BYPASS instruction and the SignalTap instructions. JTAG  
boundary-scan testing can be performed before or after configuration, but  
not during configuration. APEX 20K devices can also use the JTAG port  
for configuration with the Quartus II software or with hardware using  
either Jam Files (.jam) or Jam Byte-Code Files (.jbc). Finally, APEX 20K  
devices (except the EP20K1500E) use the JTAG port to monitor the logic  
operation of the device with the SignalTap embedded logic analyzer.  
APEX 20K devices support the JTAG instructions shown in Table 19.  
IEEE Std.  
1149.1 (JTAG)  
Boundary-Scan  
Support  
Table 19. APEX 20K JTAG Instructions  
JTAG Instruction  
Description  
SAMPLE/PRELOAD  
EXTEST  
Allows a snapshot of signals at the device pins to be captured and examined during  
normal device operation, and permits an initial data pattern to be output at the device  
pins. Also used by the SignalTap embedded logic analyzer.  
Allows the external circuitry and board-level interconnections to be tested by forcing a  
test pattern at the output pins and capturing test results at the input pins.  
BYPASS  
Places the 1-bit bypass register between the TDIand TDOpins, which allows the BST  
data to pass synchronously through selected devices to adjacent devices during  
normal device operation.  
(1)  
USERCODE  
IDCODE  
Selects the 32-bit USERCODE register and places it between the TDIand TDOpins,  
allowing the USERCODE to be serially shifted out of TDO.  
Selects the IDCODE register and places it between TDIand TDO, allowing the  
IDCODE to be serially shifted out of TDO.  
ICR Instructions  
Used when configuring an APEX 20K device via the JTAG port with a MasterBlasterTM  
or ByteBlasterMVTM download cable, or when using a Jam File or Jam Byte-Code File  
via an embedded processor.  
SignalTap Instructions  
Monitors internal device operation with the SignalTap embedded logic analyzer.  
(1)  
Note:  
(1) The EP20K1500E device supports the JTAG BYPASS instruction and the SignalTap instructions.  
Altera Corporation  
55  
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