APEX 20K Programmable Logic Device Family Data Sheet
Figure 32. APEX 20K AC Test Conditions
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the device
outputs discharge the load capacitances.
When these transients flow through the
parasitic inductance between the device
ground pin and the test system ground,
significant reductions in observable noise
immunity can result.
Device
Output
to Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
Tables 23 through 26 provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V APEX 20K devices.
Operating
Conditions
Table 23. APEX 20K Device Absolute Maximum Ratings
Note (1)
Symbol
Parameter
Conditions
Min
Max
Unit
VCCINT
VCCIO
VI
Supply voltage
With respect to ground (2)
–0.5
–0.5
–0.5
–25
–65
–65
3.6
4.6
4.6
25
V
V
DC input voltage
V
IOUT
TSTG
TAMB
TJ
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
mA
° C
° C
° C
No bias
150
135
135
Under bias
PQFP, RQFP, TQFP, and BGA packages,
under bias
Ceramic PGA packages, under bias
150
° C
Altera Corporation
59
ETC [ ETC ]
