R
XC5200 Series Field Programmable Gate Arrays
XC5200 Switching Characteristics
Definition of Terms
In the following tables, some specifications may be designated as Advance or Preliminary. These terms are defined as
follows:
Advance:
Initial estimates based on simulation and/or extrapolation from other speed grades, devices, or device
families. Use as estimates, not for production.
Preliminary: Based on preliminary characterization. Further changes are not expected.
Unmarked: Specifications not identified as either Advance or Preliminary are to be considered Final.
1
XC5200 Operating Conditions
Symbol
Description
Supply voltage relative to GND Commercial: 0°C to 85°C junction
Supply voltage relative to GND Industrial: -40°C to 100°C junction
High-level input voltage — TTL configuration
Low-level input voltage — TTL configuration
High-level input voltage — CMOS configuration
Low-level input voltage — CMOS configuration
Input signal transition time
Min
4.75
4.5
2.0
0
Max
5.25
5.5
Units
V
VCC
V
VIHT
VILT
VIHC
VILC
TIN
VCC
V
0.8
V
70%
0
100%
20%
250
VCC
VCC
ns
XC5200 DC Characteristics Over Operating Conditions
Symbol
VOH
VOL
Description
High-level output voltage @ IOH = -8.0 mA, VCC min
Low-level output voltage @ IOL = 8.0 mA, VCC max
Quiescent FPGA supply current (Note 1)
Leakage current
Min
Max
Units
V
7
3.86
0.4
15
V
ICCO
IIL
mA
µA
pF
-10
+10
15
CIN
Input capacitance (sample tested)
IRIN
Pad pull-up (when selected) @ VIN = 0V (sample tested)
0.02
0.30
mA
Note: 1. With no output current loads, all package pins at Vcc or GND, either TTL or CMOS inputs, and the FPGA configured with a
tie option.
XC5200 Absolute Maximum Ratings
Symbol
VCC
Description
Supply voltage relative to GND
Units
V
-0.5 to +7.0
-0.5 to VCC +0.5
-0.5 to VCC +0.5
-65 to +150
+260
VIN
Input voltage with respect to GND
V
VTS
TSTG
TSOL
TJ
Voltage applied to 3-state output
V
Storage temperature (ambient)
°C
°C
°C
°C
Maximum soldering temperature (10 s @ 1/16 in. = 1.5 mm)
Junction temperature in plastic packages
Junction temperature in ceramic packages
+125
+150
Note: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Recommended
Operating Conditions is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may
affect device reliability.
1. Notwithstanding the definition of the above terms, all specifications are subject to change without notice.
November 5, 1998 (Version 5.2)
7-127
ETC [ ETC ]
