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XQ4013E-3BG191N 参数 Datasheet PDF下载

XQ4013E-3BG191N图片预览
型号: XQ4013E-3BG191N
PDF下载: 下载PDF文件 查看货源
内容描述: QPRO XQ4000E / EX QML高可靠性的FPGA [QPRO XQ4000E/EX QML High-Reliability FPGAs]
分类和应用:
文件页数/大小: 36 页 / 300 K
品牌: XILINX [ XILINX, INC ]
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QPRO XQ4000E/EX QML High-Reliability FPGAs  
Table 1: XQ4000E/EX Field Programmable Gate Arrays  
Max.  
Logic  
Gates  
Max.  
RAM Bits  
(No  
Typical  
Max.  
Decode  
Inputs  
Gate Range  
(Logic and  
Number  
of  
Max.  
User  
I/O  
CLB  
Total  
(1)  
Device  
(No RAM)  
Logic)  
RAM)  
Matrix CLBs Flip-Flops per Side  
Packages  
XQ4005E  
5,000  
6,272  
3,000 - 9,000 14 x 14  
7,000 - 20,000 20 x 20  
196  
400  
616  
42  
60  
112  
PG156,  
CB164  
XQ4010E  
XQ4013E  
10,000  
12,800  
1,120  
160  
PG191,  
CB196,  
HQ208  
13,000  
18,432  
10,000 - 30,000 24 x 24  
576  
1,536  
72  
192  
PG223,  
CB228,  
HQ240  
XQ4025E  
25,000  
28,000  
32,768  
32,768  
15,000 - 45,000 32 x 32 1,024  
18,000 - 50,000 32 x 32 1,024  
2,560  
2,560  
96  
96  
256  
256  
PG299,  
CB228  
XQ4028EX  
PG299,  
CB228,  
HQ240,  
BG352  
Notes:  
1. Max values of Typical Gate Range include 20-30% of CLBs used as RAM.  
XQ4000E Switching Characteristics  
XQ4000E Absolute Maximum Ratings(1)  
Symbol  
Description  
Units  
V
Supply voltage relative to GND  
0.5 to +7.0  
V
CC  
(2)  
V
Input voltage relative to GND  
0.5 to V + 0.5  
V
IN  
CC  
(2)  
V
Voltage applied to High-Z output  
Storage temperature (ambient)  
0.5 to V + 0.5  
V
TS  
CC  
T
T
65 to +150  
+260  
°C  
°C  
°C  
°C  
STG  
SOL  
Maximum soldering temperature (10s @ 1/16 in. = 1.5 mm)  
T
Junction temperature  
Ceramic package  
Plastic package  
+150  
J
+125  
Notes:  
1. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress  
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions  
is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.  
2. Maximum DC excursion above V or below Ground must be limited to either 0.5V or 10 mA, whichever is easier to achieve. During  
CC  
transitions, the device pins may undershoot to 2.0V or overshoot to V + 2.0V, provided this over or undershoot lasts less than  
CC  
10 ns and with the forcing current being limited to 200 mA.  
2
www.xilinx.com  
DS021 (v2.2) June 25, 2000  
1-800-255-7778  
Product Specification  
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