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TM4SN64EPU-12A 参数 Datasheet PDF下载

TM4SN64EPU-12A图片预览
型号: TM4SN64EPU-12A
PDF下载: 下载PDF文件 查看货源
内容描述: 同步动态RAM模块 [SYNCHRONOUS DYNAMIC RAM MODULES]
分类和应用: 内存集成电路动态存储器时钟
文件页数/大小: 16 页 / 273 K
品牌: TI [ TEXAS INSTRUMENTS ]
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TM2SN64EPU 2097152 BY 64-BIT  
TM4SN64EPU 4194304 BY 64-BIT  
SYNCHRONOUS DYNAMIC RAM MODULES  
SMMS681 – AUGUST 1997  
ac timing requirements  
’xSN64EPU-12A  
’xSN64EPU-12  
UNIT  
MIN MAX  
MIN MAX  
t
t
t
t
t
t
t
Access time, CK high to data out, CAS latency = 2 (see Note 8)  
Access time, CK high to data out, CAS latency = 3 (see Note 8)  
Cycle time, CK, CAS latency = 2  
9
10  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
AC2  
AC3  
CK2  
CK3  
LZ  
9
9
15  
12  
3
18  
Cycle time, CK, CAS latency = 3  
12  
Delay time, CK high to DQ in low-impedance state (see Note 9)  
Delay time, CK high to DQ in high-impedance state (see Note 10)  
Delay time, ACTV command to DEAC or DCAB command  
3
10  
10  
HZ  
60 100000  
72 100000  
RAS  
Delay time, ACTV, MRS, REFR, or SLFR to ACTV, MRS, REFR, or SLFR  
command  
t
t
90  
108  
30  
ns  
ns  
RC  
Delay time, ACTV command to READ, READ-P, WRT, or WRT-P command  
(see Note 11)  
30  
RCD  
t
t
t
t
Delay time, DEAC or DCAB command to ACTV, MRS, REFR, or SLFR command  
Delay time, ACTV command in one bank to ACTV command in the other bank  
Delay time, MRS command to ACTV, MRS, REFR, or SLFR command  
Final data out of READ-P operation to ACTV, MRS, SLFR, or REFR command  
30  
24  
24  
36  
24  
24  
ns  
ns  
ns  
ns  
RP  
RRD  
RSA  
APR  
t
– (CL –1)  
t
RP  
CK  
3
t
t
t
t
t
t
t
t
t
t
Hold time, CK high to data out  
3
1
ns  
ns  
OH  
Hold time, address, control, and data input  
1.5  
10  
4
IH  
Power down/self-refresh exit time  
10  
4
ns  
CESP  
CH  
CL  
Pulse duration, CK high  
ns  
Pulse duration, CK low  
4
4
ns  
Setup time, address, control, and data input  
3
3
ns  
IS  
Final data in of WRT-P operation to ACTV, MRS, SLFR, or REFR command  
Delay time, final data in of WRT operation to DEAC or DCAB command  
Transition time (see Note 12)  
60  
15  
1
60  
20  
1
ns  
APW  
WR  
T
ns  
5
5
ns  
Refresh interval  
64  
64  
ms  
REF  
n
n
n
n
n
n
Delay time, READ or WRT command to an interrupting command  
Delay time, CS low or high to input enabled or inhibited  
Delay time, CKE high or low to CK enabled or disabled  
Delay time, final data in of WRT operation to READ, READ-P, WRT, WRT-P  
Delay time, ENBL or MASK command to enabled or masked data in  
Delay time, ENBL or MASK command to enabled or masked data out  
1
0
1
1
0
2
1
0
1
1
0
2
cycle  
cycle  
cycle  
cycle  
cycle  
cycle  
CCD  
CDD  
CLE  
CWL  
DID  
0
1
0
1
0
2
0
2
DOD  
Delay time, DEAC or DCAB command to DQ in high-impedance state,  
CAS latency = 2  
n
2
2
cycle  
HZP2  
Delay time, DEAC or DCAB command to DQ in high-impedance state,  
CAS latency = 3  
n
n
3
0
3
0
cycle  
cycle  
HZP3  
Delay time, WRT command to first data in  
0
0
WCD  
All references are made to the rising transition of CK unless otherwise noted.  
-12A speed device is supported only at – 5% to +10% V  
DD  
isreferencedfromtherisingtransitionofCKthatisprevioustothedata-outcycle.Forexample,thefirstdataoutt  
NOTES: 8. t  
isreferenced  
AC  
AC  
from the rising transition of CK that is CAS latency – one cycle after the READ command. Access time is measured at output  
reference level 1.4 V.  
9.  
10.  
t
is measured from the rising transition of CK that is CAS latency – one cycle after the READ command.  
MAX defines the time at which the outputs are no longer driven and is not referenced to output voltage levels.  
LZ  
t
HZ  
11. For read or write operations with automatic deactivate, t  
12. Transition time, t , is measured between V and V  
IH  
must be set to satisfy minimum t .  
RAS  
RCD  
.
IL  
T
9
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
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