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S71GL064A80BAI0F3 参数 Datasheet PDF下载

S71GL064A80BAI0F3图片预览
型号: S71GL064A80BAI0F3
PDF下载: 下载PDF文件 查看货源
内容描述: 堆叠式多芯片产品( MCP )闪存和RAM [Stacked Multi-Chip Product (MCP) Flash Memory and RAM]
分类和应用: 闪存
文件页数/大小: 102 页 / 1762 K
品牌: SPANSION [ SPANSION ]
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A d v a n c e I n f o r m a t i o n  
Capacitance  
Parameter  
Description  
Te st Co nd i ti on  
Max  
8
Unit  
CIN  
Input Capacitance  
Output Capacitance  
TA = 25°C, f = 1 MHz,  
VCC = VCC(typ.)  
pF  
COUT  
8
Note: Tested initially and after any design or process changes that may affect these parameters.  
Thermal Resistance  
Parameter  
Description  
Test Conditions  
VFBGA  
Unit  
θ JA  
Thermal Resistance (Junction to Ambient) Test conditions follow standard test methods  
and procedures for measuring thermal  
55  
°C/W  
θ JC  
Thermal Resistance (Junction to Case)  
17  
impedance, per EIA / JESD51.  
Note: Tested initially and after any design or process changes that may affect these parameters.  
AC Test Loads and Waveforms  
R1  
VCC  
ALL INPUT PULSES  
90%  
10%  
Fall Time: 1 V/ns  
V
CC  
OUTPUT  
90%  
10%  
GND  
Rise Time: 1 V/ns  
R2  
30 pF  
INCLUDING  
JIG AND  
SCOPE  
Equivalent to:  
THÉVENINEQUIVALENT  
RTH  
OUTPUT  
VTH  
Figure 25. AC Test Loads and Waveforms  
Parameters  
3.0V VCC  
22000  
22000  
11000  
1.50  
Unit  
R1  
R2  
RTH  
VTH  
V
March 31, 2005 S71GL032A_00_A0  
S71GL032A Based MCPs  
83  
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