November 2006
PCS5I9658
rev 0.3
Table 3: Absolute Maximum Ratings1
Symbol
VCC
VIN
VOUT
IIN
Characteristics
Min
-0.3
-0.3
-0.3
Max
Unit Condition
3.9
V
Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Current
DC Output Current
Storage Temperature
VCC+0.3
VCC+0.3
±20
±50
125
V
V
mA
mA
°C
IOUT
TS
-65
Note: 1 These are stress ratings only and are not implied for functional use. Exposure to absolute maximum ratings for prolonged periods of time may affect
device reliability.
Table 4: GENERAL SPECIFICATIONS
Symbol
VTT
Characteristics
Output Termination Voltage
Min
Typ
VCC÷2
Max
Unit
V
Condition
MM
HBM
LU
CPD
CIN
ESD Protection (Machine Model)
ESD Protection (Human Body Model)
Latch-Up Immunity
Power Dissipation Capacitance
Input Capacitance
200
2000
200
V
V
mA
pF
pF
10
4.0
Per output
Inputs
LQFP 32 Thermal resistance junction to ambient
JESD 51-3, single layer test board
Natural
convection
83.1
86.0
°C/W
°C/W
°C/W
°C/W
°C/W
73.3
68.9
75.4
70.9
100 ft/min
200 ft/min
63.8
57.4
65.3
59.6
400 ft/min
800 ft/min
θ
JA
Natural
JESD 51-6, 2S2P multilayer test board
59.0
54.4
52.5
60.6
55.7
53.8
°C/W
°C/W
°C/W
°C/W
°C/W
convection
100 ft/min
200 ft/min
50.4
47.8
51.5
48.8
400 ft/min
800 ft/min
MIL-SPEC 883E
Method 1012.1
LQFP 32 Thermal resistance junction to case
23.0
26.3
θ
JC
°C/W
3.3V 1:10 LVCMOS PLL Clock Generator
4 of 15
Notice: The information in this document is subject to change without notice.
PULSECORE [ PulseCore Semiconductor ]
