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28F320J5 参数 Datasheet PDF下载

28F320J5图片预览
型号: 28F320J5
PDF下载: 下载PDF文件 查看货源
内容描述: 的StrataFlash存储器技术32和64 MBIT [StrataFlash MEMORY TECHNOLOGY 32 AND 64 MBIT]
分类和应用: 存储
文件页数/大小: 53 页 / 638 K
品牌: INTEL [ INTEL ]
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E
INTEL StrataFlash™ MEMORY TECHNOLOGY, 32 AND 64 MBIT  
3.3 Standby  
Table 2. Chip Enable Truth Table(1,2)  
CE2  
VIL  
VIL  
VIL  
VIL  
VIH  
VIH  
VIH  
VIH  
CE1  
VIL  
VIL  
VIH  
VIH  
VIL  
VIL  
VIH  
VIH  
CE0  
VIL  
VIH  
VIL  
VIH  
VIL  
VIH  
VIL  
VIH  
DEVICE  
Enabled  
Disabled  
Disabled  
Disabled  
Enabled  
Enabled  
Enabled  
Disabled  
CE0, CE1, and CE2 can disable the device (see  
Table 2, Chip Enable Truth Table) and place it in  
standby mode which substantially reduces device  
power consumption. DQ0–DQ15 outputs are placed  
in a high-impedance state independent of OE#. If  
deselected during block erase, program, or lock-bit  
configuration, the WSM continues functioning, and  
consuming active power until the operation  
completes.  
3.4  
Reset/Power-Down  
RP# at VIL initiates the reset/power-down mode.  
In read modes, RP#-low deselects the memory,  
places output drivers in a high-impedance state,  
and turns off numerous internal circuits. RP# must  
be held low for a minimum of tPLPH. Time tPHQV is  
required after return from reset mode until initial  
memory access outputs are valid. After this wake-  
up interval, normal operation is restored. The CUI is  
reset to read array mode and status register is set  
to 80H.  
NOTE:  
1. See Application Note AP-647 Intel StrataFlash™  
Memory Design Guide for typical CE configurations.  
2. For single-chip applications CE2 and CE1 can be  
strapped to GND.  
3.1  
Read  
Information can be read from any block, query,  
identifier codes, or status register independent of  
During block erase, program, or lock-bit  
configuration modes, RP#-low will abort the  
operation. In default mode, STS transitions low and  
remains low for a maximum time of tPLPH + tPHRH  
until the reset operation is complete. Memory  
contents being altered are no longer valid; the data  
may be partially corrupted after a program or  
partially altered after an erase or lock-bit  
configuration. Time tPHWL is required after RP#  
goes to logic-high (VIH) before another command  
can be written.  
the VPEN voltage. RP# can be at either VIH or VHH  
.
Upon initial device power-up or after exit from  
reset/power-down mode, the device automatically  
resets to read array mode. Otherwise, write the  
appropriate read mode command (Read Array,  
Read Query, Read Identifier Codes, or Read Status  
Register) to the CUI. Six control pins dictate the  
data flow in and out of the component: CE0, CE1,  
CE2, OE#, WE#, and RP#. The device must be  
enabled (see Table 2, Chip Enable Truth Table),  
and OE# must be driven active to obtain data at the  
outputs. CE0, CE1, and CE2 are the device  
selection controls and, when enabled (see Table 2,  
Chip Enable Truth Table), select the memory  
device. OE# is the data output (DQ0–DQ15) control  
and, when active, drives the selected memory data  
As with any automated device, it is important to  
assert RP# during system reset. When the system  
comes out of reset, it expects to read from the flash  
memory. Automated flash memories provide status  
information when accessed during block erase,  
program, or lock-bit configuration modes. If a CPU  
reset occurs with no flash memory reset, proper  
initialization may not occur because the flash  
memory may be providing status information  
instead of array data. Intel’s flash memories allow  
proper initialization following a system reset through  
the use of the RP# input. In this application, RP# is  
controlled by the same RESET# signal that resets  
the system CPU.  
onto the I/O bus. WE# must be at VIH  
.
3.2  
Output Disable  
With OE# at a logic-high level (VIH), the device  
outputs are disabled. Output pins DQ0–DQ15 are  
placed in a high-impedance state.  
13  
ADVANCE INFORMATION