DDR and DDR2 SDRAM
Table 12. DDR2 SDRAM DC Electrical Characteristics for GV (typ) = 1.8 V (continued)
DD
Output low current (VOUT = 0.280 V)
IOL
13.4
—
mA
—
Notes:
1. GVDD is expected to be within 50 mV of the DRAM GVDD at all times.
2. MVREF is expected to equal 0.5 × GVDD, and to track GVDD DC variations as measured at the receiver. Peak-to-peak noise
on MVREF cannot exceed 2% of the DC value.
3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to equal
MVREF. This rail should track variations in the DC level of MVREF
.
4. Output leakage is measured with all outputs disabled, 0 V ≤ VOUT ≤ GVDD
.
Table 13 provides the DDR2 capacitance when GVDD(typ) = 1.8 V.
Table 13. DDR2 SDRAM Capacitance for GV (typ) = 1.8 V
DD
Parameter/Condition
Symbol
Min
Max
Unit
Notes
Input/output capacitance: DQ, DQS, DQS
Delta input/output capacitance: DQ, DQS, DQS
Note:
CIO
6
8
pF
pF
1
1
CDIO
—
0.5
1. This parameter is sampled. GVDD = 1.8 V 0.090 V, f = 1 MHz, TA = 25°C, VOUT = GVDD/2, VOUT (peak-to-peak) = 0.2 V.
Table 14 provides the recommended operating conditions for the DDR SDRAM component(s) when
GV (typ) = 2.5 V.
DD
Table 14. DDR SDRAM DC Electrical Characteristics for GV (typ) = 2.5 V
DD
Parameter/Condition
I/O supply voltage
Symbol
Min
Max
Unit
Notes
GVDD
MVREF
VTT
2.375
0.49 × GVDD
MVREF – 0.04
MVREF + 0.18
–0.3
2.625
0.51 × GVDD
MVREF + 0.04
GVDD + 0.3
MVREF – 0.18
–9.9
V
V
1
2
I/O reference voltage
I/O termination voltage
Input high voltage
V
3
VIH
V
—
—
4
Input low voltage
VIL
V
Output leakage current
Output high current (VOUT = 1.95 V)
Output low current (VOUT = 0.35 V)
Notes:
IOZ
–9.9
μA
mA
mA
IOH
–15.2
—
—
—
IOL
15.2
—
1. GVDD is expected to be within 50 mV of the DRAM GVDD at all times.
2. MVREF is expected to be equal to 0.5 × GVDD, and to track GVDD DC variations as measured at the receiver. Peak-to-peak
noise on MVREF may not exceed 2% of the DC value.
3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be
equal to MVREF. This rail should track variations in the DC level of MVREF
.
4. Output leakage is measured with all outputs disabled, 0 V ≤ VOUT ≤ GVDD
.
MPC8347EA PowerQUICC II Pro Integrated Host Processor Hardware Specifications, Rev. 12
Freescale Semiconductor
17
FREESCALE [ Freescale ]
