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AM79C978KC/W 参数 Datasheet PDF下载

AM79C978KC/W图片预览
型号: AM79C978KC/W
PDF下载: 下载PDF文件 查看货源
内容描述: 单芯片1/10 Mbps的PCI家庭网络控制器 [Single-Chip 1/10 Mbps PCI Home Networking Controller]
分类和应用: 控制器PC
文件页数/大小: 261 页 / 3499 K
品牌: AMD [ AMD ]
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The PCI bus interface clock (CLK) is not required to be  
running while the device is operating in Magic Packet  
mode. Either of the INTA, the LED pins, or the PME sig-  
nal may be used to indicate the receipt of a Magic  
Packet frame when the CLK is stopped. If the system  
wishes to stop the CLK, it will do so after enabling the  
Magic Packet mode.  
Table 18. IEEE 1149.1 Supported Instruction  
Summary  
Selected  
Data  
Description Mode Register  
Instruction Instruction  
Name  
Code  
EXTEST  
0000  
External Test  
Test  
Normal ID REG  
Normal BSR  
BSR  
CAUTION: To prevent unwanted interrupts from other  
active parts of the controller, care must be taken to  
mask all likely interruptible events during Magic Packet  
mode. An example would be the interrupts from the  
Media Independent Interface, which could occur while  
the device is in Magic Packet mode.  
ID Code  
Inspection  
IDCODE  
0001  
Sample  
Boundary  
SAMPLE  
TRIBYP  
0010  
0011  
Force Float Normal Bypass  
Control  
SETBYP  
BYPASS  
0100  
1111  
Boundary to  
I/0  
Test  
Bypass  
IEEE 1149.1 (1990) Test Access Port  
Interface  
Bypass Scan Normal Bypass  
An IEEE 1149.1-compatible boundary scan Test Ac-  
cess Port is provided for board-level continuity test and  
diagnostics. All digital input, output, and input/output  
pins are tested. The following paragraphs summarize  
the IEEE 1149.1-compatible test functions imple-  
mented in the controller.  
Instruction Register and Decoding Logic  
After the TAP FSM is reset, the IDCODE instruction is  
always invoked. The decoding logic gives signals to  
control the data flow in the data registers according to  
the current instruction.  
Boundary Scan Circuit  
Boundary Scan Register  
The boundary scan test circuit requires four pins (TCK,  
TMS, TDI, and TDO), defined as the Test Access Port  
(TAP). It includes a finite state machine (FSM), an in-  
struction register, a data register array, and a power-on  
reset circuit. Internal pull-up resistors are provided for  
the TDI, TCK, and TMS pins.  
Each Boundary Scan Register (BSR) cell has two  
stages. A flip-flop and a latch are used for the Serial  
Shift Stage and the Parallel Output Stage, respectively.  
There are four possible operation modes in the BSR  
cell shown in Table 19.  
TAP Finite State Machine  
Table 19. BSR Mode Of Operation  
The TAP engine is a 16-state finite state machine  
(FSM), driven by the Test Clock (TCK), and the Test  
Mode Select (TMS) pins. An independent power-on  
reset circuit is provided to ensure that the FSM is in the  
TEST_LOGIC_RESET state at power-up. Therefore,  
the TRST is not provided. The FSM is also reset when  
TMS and TDI are high for five TCK periods.  
1
2
3
4
Capture  
Shift  
Update  
System Function  
Other Data Registers  
Other data registers are the following:  
Supported Instructions  
1. Bypass register (1 bit)  
In addition to the minimum IEEE 1149.1 requirements  
(BYPASS, EXTEST, and SAMPLE instructions), three  
additional instructions (IDCODE, TRIBYP, and SET-  
BYP) are provided to further ease board-level testing.  
All unused instruction codes are reserved. See Table  
18 for a summary of supported instructions.  
2. Device ID register (32 bits) (Table 20).  
Table 20. Device ID Register  
Bits 31-28  
Bits 27-12  
Version  
Part Number (0010 0110 0010 0110)  
Manufacturer ID. The 11 bit manufacturer ID  
cod for AMD is 00000000001 in accordance  
with JEDEC publication 106-A.  
Bits 11-1  
Bit 0  
Always a logic 1  
Note: The content of the Device ID register is the  
same as the content of CSR88.  
Am79C978  
91  
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