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AD7769JP 参数 Datasheet PDF下载

AD7769JP图片预览
型号: AD7769JP
PDF下载: 下载PDF文件 查看货源
内容描述: LC2MOS模拟量I / O端口 [LC2MOS Analog I/O Port]
分类和应用:
文件页数/大小: 16 页 / 267 K
品牌: ADI [ ADI ]
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AD7769  
TIMING CHARACTERISTICS  
(V = +5 V ؎ 5%; V = +12 V ؎ 10%; AGND [ADC] = AGND [DAC] = DGND = 0 V.  
For ADC and DAC, VBIAS = +5 V, VSWING = +2.5 V.)  
CC  
DD  
1, 2  
Lim it at Lim it at  
P aram eter  
Label  
+25؇C  
TMIN, TMAX Units  
Test Conditions/Com m ents  
ADC /DAC CONT ROL T IMING  
CS to WR Setup T ime  
CS to WR Hold T ime  
ADC/DAC to WR Setup T ime  
ADC/DAC to WR Hold T ime  
CHA/CHB to WR Setup T ime  
CHA/CHB to WR Hold T ime  
WR Pulse Width  
t1  
t2  
t3  
t4  
t5  
t6  
t7  
0
0
0
0
0
0
80  
0
0
0
0
0
0
80  
ns min  
ns min  
ns  
ns min  
ns min  
ns min  
ns min  
ADC CONVERSION T IMING  
Using External Clock  
Load Circuit of Figure 3, CL = 20 pF  
WR to INT Low Delay  
Using Internal Clock  
WR to INT Low Delay  
WR to INT High Delay  
t8  
2.6  
2.6  
µs max  
Load Circuit of Figure 3, CL = 20 pF  
T ypically 2.5 µs  
Load Circuit of Figure 3, CL = 20 pF  
Load Circuit of Figure 3, CL = 100 pF  
Load Circuit of Figure 1, CL = 20 pF  
Load Circuit of Figure 1, CL = 100 pF  
t8  
t9  
t9  
t10  
t10  
1.9/3.0  
85  
120  
t8+70  
t8+110  
1.9/3.0  
85  
120  
t8+70  
t8+110  
µs min/max  
ns max  
ns max  
ns max  
ns max  
WR to Data Valid Delay3  
ADC READ T IMING  
CS to RD Setup T ime  
CS to RD Hold Mode  
RD to Data Valid Delay3  
t11  
t12  
t13  
t13  
t14  
t15  
t15  
t16  
0
0
0
0
ns min  
ns min  
ns min/max  
ns min/max  
ns min/max  
ns max  
15/65  
30/100  
15/65  
80  
110  
t13  
15/65  
30/100  
15/65  
80  
110  
t13  
Load Circuit of Figure 1, CL = 20 pF  
Load Circuit of Figure 1, C L = 100 pF  
Load Circuit of Figure 2  
Load Circuit of Figure 3, CL = 20 pF  
Load Circuit of Figure 3, CL = 100 pF  
Determined by t13  
Bus Relinquish T ime after RD High4  
RD to INT High Delay  
ns max  
ns min  
RD Pulse Width  
DAC WRIT E T IMING  
Data Valid to WR Setup T ime  
Data Valid to WR Hold T ime  
WR to DAC Output Settling T ime  
t17  
t18  
t19  
65  
15  
4
65  
20  
4
ns nıin  
ns min  
µs max  
Load Circuit of Figure 4  
NOT ES  
1See Figures 11, 12 and 13.  
2Sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.  
3t10 and t13 are measured with the load circuits of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.  
4t14 is defined as the time required for the data lines to change 0.5 V when loaded with the circuits of Figure 2.  
Specifications subject to change without notice.  
Figure 1. Load Circuits for Data Access Tim e Test  
Figure 2. Load Circuits for Bus Relinquish Tim e Test  
Figure 3. Load Circuit for RD and WR to INT Delay Test  
Figure 4. Load Circuit for DAC Settling Tim e Test  
REV. A  
–4–  
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