FEDL87V2107-01
OKI Semiconductor
ML87V2107
2.7 Test Settings
2.7.1 Test Mode Settings
SUB_ADDRESS=70h(W/R): Test mode setting
DATA_BIT
BIT7
BIT6
BIT5
BIT4
4
BIT3
3
BIT2
2
BIT1
1
BIT0
0
ITST
ITST
Register name
7
6
5
SUB_ADDRESS=71h(W/R): Test mode setting
DATA_BIT
BIT7
BIT6
BIT5
BIT4
12
BIT3
11
BIT2
10
BIT1
9
BIT0
8
Register name
15
14
13
SUB_ADDRESS=79h(W/R): Test mode setting
DATA_BIT
BIT7
BIT6
BIT5
BIT4
4
BIT3
3
BIT2
2
BIT1
1
BIT0
0
OTST
Register name
7
6
5
ITST [7:0] Initial value: 0000_0000; Setting range: 0000_0000 to 1111_1111
ITST [15:8] Initial value: 0000_0000; Setting range: 0000_0000 to 1111_1111
OTST [7:0] Initial value: 0000_0000; Setting range: 0000_0000 to 1111_1111
Sets test mode: Normally fixed to 0000_0000.
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