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PZ3320N8YY 参数 Datasheet PDF下载

PZ3320N8YY图片预览
型号: PZ3320N8YY
PDF下载: 下载PDF文件 查看货源
内容描述: [LOADABLE PLD, 9.5ns, PBGA256, PLASTIC, BGA-256]
分类和应用: 时钟可编程逻辑
文件页数/大小: 32 页 / 488 K
品牌: XILINX [ XILINX, INC ]
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Philips Semiconductors  
Preliminary specification  
320 macrocell SRAM CPLD  
PZ3320C/PZ3320N  
Table 7. PZ3320 Low-Level JTAG Boundary-Scan Commands  
INSTRUCTION  
(Instruction Code)  
Register Used  
DESCRIPTION  
SAMPLE/PRELOAD  
(00010)  
Boundary-Scan Register  
The mandatory SAMPLE/PRELOAD instruction allows a snapshot of the normal operation of the component  
to be taken and examined. It also allows data values to be loaded onto the latched parallel outputs of the  
Boundary-Scan Shift-Register prior to selection of the other boundary-scan test instructions.  
EXTEST  
(00000)  
Boundary-Scan Register  
The mandatory EXTEST instruction allows testing of off-chip circuitry and board level interconnections. Data  
would typically be loaded onto the latched parallel outputs of Boundary-Scan Shift-Register using the  
SAMPLE/PRELOAD instruction prior to selection of the EXTEST instruction.  
BYPASS  
(11111)  
Bypass Register  
Places the 1 bit bypass register between the tdi and tdo pins, which allows the BST data to pass  
synchronously through the selected device to adjacent devices during normal device operation. The BYPASS  
instruction can be entered by holding tdi at a constant high value and completing an Instruction-Scan cycle.  
IDCODE  
(00001)  
Boundary-Scan Register  
Selects the IDCODE register and places it between tdi and tdo, allowing the IDCODE to be serially shifted  
out of tdo. The IDCODE instruction permits blind interrogation of the components assembled onto a printed  
circuit board. Thus, in circumstances where the component population may vary, it is possible to determine  
what components exist in a product.  
HIGHZ  
(00101)  
Bypass Register  
The HIGHZ instruction places the component in a state in which all of its system logic outputs are placed in  
an inactive drive state (e.g., high impedance). In this state, an in-circuit test system may drive signals onto  
the connections normally driven by a component output without incurring the risk of damage to the  
component. The HIGHZ instruction also forces the Bypass Register between tdi and tdo.  
TCK  
TMS  
t
S
t
H
t
t
CL  
CH  
TDI  
t
D
TDO  
SP00613  
Figure 29. Boundary Scan Timing Diagram  
Table 8. Boundary scan timing characteristics  
SYMBOL  
PARAMETER  
MIN  
20  
0
MAX  
UNIT  
t
t
t
t
f
t
tdi/tms to tck setup time  
tdi/tms from tck hold time  
tck high time  
ns  
ns  
S
H
50  
50  
ns  
CH  
CL  
TCK  
D
tck low time  
ns  
tck frequency  
10  
20  
MHz  
ns  
tck to tdo delay  
24  
1998 Jul 22  
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