R
Platform Flash XL High-Density Configuration and Storage Device
Table 27: DC Characteristics: Voltages
Symbol
VIL
Parameter
Input Low voltage
Test condition
Min
Typ
–
Max
Unit
V
–
0
0.4
VIH
Input High voltage
–
VDDQ –0.4
–
VDDQ + 0.4
V
VOL
Output Low voltage
IOL = 100 μA
–
–
0.1
–
V
VOH
Output High voltage
IOH = –100 μA
VDDQ –0.1
–
V
VPP1
VPP program voltage-logic
VPP program voltage factory
Program or erase lockout
VDD power-down threshold
VDD power-on reset threshold
VDDQ power-on reset threshold
Program, Erase
VDDQ –0.4
–
VDDQ +0.4
9.5
V
VPPH
VPPLK
VDDPD
VDDPOR
VDQPOR
Program, Erase
8.5
–
9.0
–
V
–
–
–
–
0.4
V
–
–
1.5
V
–
–
1.6
V
–
–
1.6
V
X-Ref Target - Figure 25
TAVAV
A22–A0
VALID
VALID
TAXQX
TAVLH
TLHAX
TAVQV
L(2)
TLLLH
TLLQV
TELLH
E
TELQV
TELQX
TEHQX
TEHQZ
G
TGLQV
TGLQX
TGHQX
TGHQZ
Hi-Z
Hi-Z
DQ15–DQ0
VALID
TGLTV
TEHTZ
TELTV
TGHTZ
READY_WAIT(1)
DS617_20_101608
Notes:
1. Write Enable, W, is High, READY_WAIT is active Low.
2. Latch Enable, L, can be kept Low (also at board level) when the Latch Enable function is not required or supported.
Figure 25: Asynchronous Random Access Read AC Waveforms, CR4 = 0
DS617 (v3.0.1) January 07, 2010
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Product Specification
46