WCSN0436V1P
Capacitance
[12]
Parameter
C
IN
C
CLK
C
I/O
Description
Input Capacitance
Clock Input Capacitance
Input/Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
DD
= 3.3V,
V
DDQ
= 3.3V
Max.
4
4
4
Unit
pF
pF
pF
AC Test Loads and Waveforms
3.3V
OUTPUT
Z
0
=50Ω
R
L
=50Ω
V
L
= 1.5V
3.0V
5 pF
R=351Ω
INCLUDING
JIG AND
SCOPE
GND
R=317Ω
[13]
OUTPUT
ALL INPUT PULSES
(a)
(b)
1350B-2
Thermal Resistance
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
Still Air, soldered on a 4.25 x 1.125 inch,
4-layer printed circuit board
Symbol
Θ
JA
Θ
JC
TQFP Typ.
28
4
Units
°C/W
°C/W
Notes
12
Notes:
12. Tested initially and after any design or process change that may affect these parameters.
13. A/C test conditions assume signal transition time of 2 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading shown in
part (a) of AC Test Loads.
Document #: 38-05246 Rev. **
Page 8 of 14
WEIDA [ WEIDA SEMICONDUCTOR, INC. ]
