WCSN0436V1P
Electrical Characteristics
Over the Operating Range
Parame-
ter
V
DD
V
DDQ
V
OH
V
OL
V
IH
V
IL
I
X
Description
Power Supply Voltage
I/O Supply Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
[9]
Input Load Current
Input Current of
MODE
I
OZ
I
CC
Output Leakage
Current
V
DD
Operating
Supply
GND
≤
V
I
≤
V
DDQ,
Output Disabled
V
DD
= Max., I
OUT
= 0 mA,
f = f
MAX
= 1/t
CYC
5.0-ns cycle, 166 MHz
6.6-ns cycle, 150 MHz
7.0-ns cycle, 143 MHz
7.5-ns cycle, 133 MHz
10.0-ns cycle, 100 MHz
12.5-ns cycle, 80 MHz
I
SB1
Automatic CE
Power-Down
Current—TTL Inputs
Max. V
DD
, Device Deselected,
V
IN
≥
V
IH
or V
IN
≤
V
IL
f = f
MAX
= 1/t
CYC
5.0-ns cycle, 166 MHz
6.6-ns cycle, 150 MHz
7.0-ns cycle, 143 MHz
7.5-ns cycle, 133 MHz
10.0-ns cycle, 100 MHz
12.5-ns cycle, 80 MHz
I
SB2
Automatic CE
Power-Down
Current—CMOS
Inputs
Automatic CE
Power-Down
Current—CMOS
Inputs
Max. V
DD
, Device Deselected,
V
IN
≤
0.3V or V
IN
>
V
DDQ
– 0.3V, f = 0
Max. V
DD
, Device Deselected, or
V
IN
≤
0.3V or V
IN
> V
DDQ
– 0.3V
f = f
MAX
= 1/t
CYC
All speed grades
GND
≤
V
I
≤
V
DDQ
V
DD
= Min., I
OH
= –4.0 mA
[11]
V
DD
= Min., I
OL
= 8.0 mA
[11]
2.0
−0.3
−5
−30
−5
Test Conditions
Min.
3.135
3.135
2.4
0.4
V
DD
+
0.3V
0.8
5
30
5
400
375
350
300
250
200
80
70
60
50
40
35
5
Max.
3.465
3.465
Unit
V
V
V
V
V
V
µA
µA
µA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
I
SB3
5.0-ns cycle, 166 MHz
6.6-ns cycle, 150 MHz
7.0-ns cycle, 143 MHz
7.5-ns cycle, 133 MHz
10.0-ns cycle, 100 MHz
12.5-ns cycle, 80 MHz
70
60
50
40
30
25
mA
mA
mA
mA
mA
mA
Note:
11. The load used for V
OH
and V
OL
testing is shown in Figure (b) of the AC Test Loads.
Document #: 38-05246 Rev. **
Page 7 of 14
WEIDA [ WEIDA SEMICONDUCTOR, INC. ]
