欢迎访问ic37.com |
会员登录 免费注册
发布采购

RM46L450PGET 参数 Datasheet PDF下载

RM46L450PGET图片预览
型号: RM46L450PGET
PDF下载: 下载PDF文件 查看货源
内容描述: RM46Lx50 16位/ 32位RISC闪存微控制器 [RM46Lx50 16/32-Bit RISC Flash Microcontroller]
分类和应用: 闪存微控制器
文件页数/大小: 172 页 / 2534 K
品牌: TI [ TEXAS INSTRUMENTS ]
 浏览型号RM46L450PGET的Datasheet PDF文件第67页浏览型号RM46L450PGET的Datasheet PDF文件第68页浏览型号RM46L450PGET的Datasheet PDF文件第69页浏览型号RM46L450PGET的Datasheet PDF文件第70页浏览型号RM46L450PGET的Datasheet PDF文件第72页浏览型号RM46L450PGET的Datasheet PDF文件第73页浏览型号RM46L450PGET的Datasheet PDF文件第74页浏览型号RM46L450PGET的Datasheet PDF文件第75页  
RM46L450  
RM46L850  
www.ti.com  
SPNS184 SEPTEMBER 2012  
4.7 Clock Monitoring  
The LPO Clock Detect (LPOCLKDET) module consists of a clock monitor (CLKDET) and an internal low  
power oscillator (LPO).  
The LPO provides two different clock sources – a low frequency (LFLPO) and a high frequency (HFLPO).  
The CLKDET is a supervisor circuit for an externally supplied clock signal (OSCIN). In case the OSCIN  
frequency falls out of a frequency window, the CLKDET flags this condition in the global status register  
(GLBSTAT bit 0: OSC FAIL) and switches all clock domains sourced by OSCIN to the HFLPO clock (limp  
mode clock).  
The valid OSCIN frequency range is defined as: fHFLPO / 4 < fOSCIN < fHFLPO * 4.  
4.7.1 Clock Monitor Timings  
For more information on LPO and Clock detection, refer to Table 4-10.  
upper  
threshold  
lower  
threshold  
guaranteed fail  
guaranteed pass  
guaranteed fail  
f[MHz]  
1.375  
4.875  
22  
78  
Figure 4-9. LPO and Clock Detection, Untrimmed HFLPO  
4.7.2 External Clock (ECLK) Output Functionality  
The ECLK pin can be configured to output a pre-scaled clock signal indicative of an internal device clock.  
This output can be externally monitored as a safety diagnostic.  
4.7.3 Dual Clock Comparators  
The Dual Clock Comparator (DCC) module determines the accuracy of selectable clock sources by  
counting the pulses of two independent clock sources (counter 0 and counter 1). If one clock is out of  
spec, an error signal is generated. For example, the DCC1 can be configured to use HFLPO as the  
reference clock (for counter 0) and VCLK as the "clock under test" (for counter 1). This configuration  
allows the DCC1 to monitor the PLL output clock when VCLK is using the PLL output as its source.  
An additional use of this module is to measure the frequency of a selectable clock source, using the input  
clock as a reference, by counting the pulses of two independent clock sources. Counter 0 generates a  
fixed-width counting window after a preprogrammed number of pulses. Counter 1 generates a fixed-width  
pulse (1 cycle) after a pre-programmed number of pulses. This pulse sets as an error signal if counter 1  
does not reach 0 within the counting window generated by counter 0.  
4.7.3.1 Features  
Takes two different clock sources as input to two independent counter blocks.  
One of the clock sources is the known-good, or reference clock; the second clock source is the "clock  
under test."  
Each counter block is programmable with initial, or seed values.  
The counter blocks start counting down from their seed values at the same time; a mismatch from the  
expected frequency for the clock under test generates an error signal which is used to interrupt the  
CPU.  
Copyright © 2012, Texas Instruments Incorporated  
System Information and Electrical Specifications  
Submit Documentation Feedback  
Product Folder Links: RM46L450 RM46L850  
71  
 
 复制成功!