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ICM-20602 参数 Datasheet PDF下载

ICM-20602图片预览
型号: ICM-20602
PDF下载: 下载PDF文件 查看货源
内容描述: [High Performance 6-Axis MEMS MotionTracking Device]
分类和应用:
文件页数/大小: 57 页 / 1348 K
品牌: TDK [ TDK ELECTRONICS ]
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ICM-20602  
Register Name: GYRO_YOUT_L  
Register Type: READ only  
Register Address: 70 (Decimal); 46 (Hex)  
BIT  
NAME  
FUNCTION  
Low byte of the Y-Axis gyroscope output  
[7:0]  
GYRO_YOUT[7:0]  
GYRO_YOUT = Gyro_Sensitivity * Y_angular_rate  
FS_SEL = 0  
Gyro_Sensitivity = 131 LSB/(º/s)  
Nominal  
Conditions  
Register Name: GYRO_ZOUT_H  
Register Type: READ only  
Register Address: 71 (Decimal); 47 (Hex)  
BIT  
[7:0]  
NAME  
GYRO_ZOUT[15:8]  
FUNCTION  
High byte of the Z-Axis gyroscope output  
Register Name: GYRO_ZOUT_L  
Register Type: READ only  
Register Address: 72 (Decimal); 48 (Hex)  
BIT  
NAME  
FUNCTION  
Low byte of the Z-Axis gyroscope output  
GYRO_ZOUT = Gyro_Sensitivity * Z_angular_rate  
[7:0]  
GYRO_ZOUT[7:0]  
Nominal  
Conditions  
FS_SEL = 0  
Gyro_Sensitivity = 131 LSB/(º/s)  
9.32 REGISTER 80 TO 82 GYROSCOPE SELF-TEST REGISTERS  
Register Name: SELF_TEST_X_GYRO, SELF_TEST_Y_GYRO, SELF_TEST_Z_GYRO  
Type: READ/WRITE  
Register Address: 80, 81, 82 (Decimal); 50, 51, 52 (Hex)  
REGISTER  
BIT  
NAME  
FUNCTION  
The value in this register indicates the self-test output generated during  
manufacturing tests. This value is to be used to check against  
subsequent self-test outputs performed by the end user.  
SELF_TEST_X_GYRO  
[7:0]  
XG_ST_DATA[7:0]  
The value in this register indicates the self-test output generated during  
manufacturing tests. This value is to be used to check against  
subsequent self-test outputs performed by the end user.  
SELF_TEST_Y_GYRO  
SELF_TEST_Z_GYRO  
[7:0]  
[7:0]  
YG_ST_DATA[7:0]  
ZG_ST_DATA[7:0]  
The value in this register indicates the self-test output generated during  
manufacturing tests. This value is to be used to check against  
subsequent self-test outputs performed by the end user.  
The equation to convert self-test codes in OTP to factory self-test measurement is:  
ST _OTP (2620/2FS )*1.01(ST _code1) (lsb)  
where ST_OTP is the value that is stored in OTP of the device, FS is the Full Scale value, and ST_code is based on the Self-Test value  
ꢒ“T_ FACꢓ deteꢂꢌiꢁed iꢁ Iꢁꢄeꢁ“eꢁseꢋs faꢃtoꢂꢑ fiꢁal test aꢁd ꢃalꢃulated ꢎased oꢁ the folloꢊiꢁg eꢔuatioꢁ:  
log(ST _ FAC /(2620/2FS ))  
ST _ code round(  
) 1  
log(1.01)  
Document Number: DS-000176  
Page 44 of 57  
Revision: 1.0  
Revision Date: 10/03/2016  
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