Electrical characteristics
STM32F105xx, STM32F107xx
(1)
Table 53. ADC accuracy - limited test conditions
Symbol
Parameter
Test conditions
Typ
Max(2)
Unit
ET
EO
EG
ED
EL
Total unadjusted error
Offset error
1.3
1
2
f
PCLK2 = 56 MHz,
fADC = 14 MHz, RAIN < 10 kY,
VDDA = 3 V to 3.6 V
TA = 25 °C
1.5
1.5
1
Gain error
0.5
0.7
0.8
LSB
Differential linearity error
Integral linearity error
Measurements made after
ADC calibration
1.5
1. ADC DC accuracy values are measured after internal calibration.
2. Based on characterization, not tested in production.
(1) (2)
Table 54. ADC accuracy
Symbol
Parameter
Test conditions
Typ
Max(3)
Unit
ET
EO
EG
ED
EL
Total unadjusted error
Offset error
2
5
2.5
3
fPCLK2 = 56 MHz,
fADC = 14 MHz, RAIN < 10 kY,
1.5
1.5
1
Gain error
VDDA = 2.4 V to 3.6 V
LSB
Measurements made after
ADC calibration
Differential linearity error
Integral linearity error
2
1.5
3
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted VDD, frequency and temperature ranges.
3. Based on characterization, not tested in production.
Note:
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative currents.
Any positive injection current within the limits specified for I
Section 5.3.12 does not affect the ADC accuracy.
and UI
in
INJ(PIN)
INJ(PIN)
70/95
Doc ID 15274 Rev 4
STMICROELECTRONICS [ ST ]
