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K9F5608U0 参数 Datasheet PDF下载

K9F5608U0图片预览
型号: K9F5608U0
PDF下载: 下载PDF文件 查看货源
内容描述: 32M ×8位NAND闪存 [32M x 8 Bit NAND Flash Memory]
分类和应用: 闪存
文件页数/大小: 29 页 / 608 K
品牌: SAMSUNG [ SAMSUNG ]
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Package Dimensions  
FLASH MEMORY  
READY/BUSY  
The device has a R/B output that provides a hardware method of indicating the completion of a page program, erase and random  
read completion. The R/B pin is normally high but transitions to low after program or erase command is written to the command reg-  
ister or random read is started after address loading. It returns to high when the internal controller has finished the operation. The pin  
is an open-drain driver thereby allowing two or more R/B outputs to be Or-tied. Because pull-up resistor value is related to tr(R/B)  
and current drain during busy(ibusy) , an appropriate value can be obtained with the following reference chart(Fig 12). Its value can  
be determined by the following guidance.  
Rp  
ibusy  
VCC  
Ready Vcc  
R/B  
2.0V  
open drain output  
0.8V  
Busy  
tf  
tr  
GND  
Device  
Fig 12 Rp vs tr ,tf & Rp vs ibusy  
@ Vcc = 3.3V, Ta = 25°C , CL = 100pF  
381  
3.3  
Ibusy  
300n  
3m  
290  
1.1  
1.65  
189  
200n  
100n  
2m  
1m  
tr  
tf  
96  
0.825  
4.2  
4.2  
2K  
4.2  
3K  
4.2  
4K  
1K  
Rp(ohm)  
Rp value guidance  
VCC(Max.) - VOL(Max.)  
3.2V  
Rp(min) =  
=
IOL + SIL  
8mA + SIL  
where IL is the sum of the input currents of all devices tied to the R/B pin.  
Rp(max) is determined by maximum permissible limit of tr  
27  
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