K7I163682B
K7I161882B
512Kx36 & 1Mx18 DDRII CIO b2 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7I163682B(512Kx36)
1
2
VSS/SA*
DQ27
NC
DQ29
NC
DQ30
DQ31
VREF
NC
3
4
5
6
K
K
7
8
LD
SA
VSS
9
SA
10
VSS/SA*
NC
DQ17
NC
DQ15
NC
NC
VREF
DQ13
DQ12
NC
DQ11
NC
11
CQ
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
CQ
NC
NC
NC
NC
NC
NC
Doff
NC
NC
NC
NC
NC
NC
TDO
NC
R/W
SA
VSS
BW2
BW3
SA
BW1
BW0
SA
DQ18
DQ28
DQ19
DQ20
DQ21
DQ22
VDDQ
DQ32
DQ23
DQ24
DQ34
DQ25
DQ26
SA
NC
NC
NC
NC
NC
NC
VDDQ
NC
NC
NC
NC
NC
NC
SA
DQ8
DQ7
DQ16
DQ6
DQ5
DQ14
ZQ
DQ4
DQ3
DQ2
DQ1
DQ10
DQ0
TDI
SA0
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
SA
C
VSS
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
NC
DQ33
NC
DQ35
NC
VSS
SA
SA
VSS
SA
SA
SA
SA
SA
SA
DQ9
TMS
TCK
C
Notes : 1. * Checked No Connect(NC) pins are reserved for higher density address, i.e. 10A for 72Mb, 2A for 144Mb .
2. BW0 controls write to DQ0:DQ8, BW1 controls write to DQ9:DQ17, BW2 controls write to DQ18:DQ26 and BW3 controls write to DQ27:DQ35.
PIN NAME
SYMBOL
PIN NUMBERS
DESCRIPTION
Input Clock
NOTE
K, K
C, C
CQ, CQ
Doff
SA0
SA
6B, 6A
6P, 6R
11A, 1A
1H
Input Clock for Output Data
Output Echo Clock
DLL Disable when low
Burst Count Address Inputs
Address Inputs
1
6C
9A,4B,8B,5C,7C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
2B,3B,11B,3C,10C,11C,2D,3D,11D,3E,10E,11E,2F,3F
11F,2G,3G,11G,3J,10J,11J,3K,10K,11K,2L,3L,11L
3M,10M,11M,2N,3N,11N,3P,10P,11P
DQ0-35
Data Inputs Outputs
Read, Write Control Pin, Read active
when high
R/W
LD
4A
8A
Synchronous Load Pin, bus Cycle
sequence is to be defined when low
BW0, BW1,BW2, BW3
7B,7A,5A,5B
2H,10H
11H
Block Write Control Pin,active when low
Input Reference Voltage
Output Driver Impedance Control Input
Power Supply ( 1.8 V )
VREF
ZQ
VDD
VDDQ
2
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply ( 1.5V or 1.8V )
2A,10A,4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,
4M-8M,4N,8N
VSS
Ground
TMS
TDI
TCK
TDO
10R
11R
2R
JTAG Test Mode Select
JTAG Test Data Input
JTAG Test Clock
1R
JTAG Test Data Output
3A,1B,9B,10B,1C,2C,9C,1D,9D,10D,1E,2E,9E,
1F,9F,10F,1G,9G,10G,1J,2J,9J,1K,2K,9K
1L,9L,10L,1M,2M,9M,1N,9N,10N,1P,2P,9P
NC
No Connect
3
Notes: 1. C, C, K or K cannot be set to VREF voltage.
2. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected
3. Not connected to chip pad internally.
.
July. 2004
Rev 3.1
- 3 -
SAMSUNG [ SAMSUNG ]
