S/UNI-IMA-4 Telecom Standard Product Data Sheet
Released
BYPASS
The bypass instruction shifts data from input, TDI to output, TDO with one TCK clock period
delay. The instruction is used to bypass the device.
EXTEST
The external test instruction allows testing of the interconnection to other devices. When the
current instruction is the EXTEST instruction, the boundary scan register is placed between
input, TDI and output, TDO. Primary device inputs can be sampled by loading the boundary
scan register using the Capture-DR state. The sampled values can then be viewed by shifting
the boundary scan register using the Shift-DR state. Primary device outputs can be controlled
by loading patterns shifted in through input TDI into the boundary scan register using the
Update-DR state.
SAMPLE
The sample instruction samples all the device inputs and outputs. For this instruction, the
boundary scan register is placed between TDI and TDO. Primary device inputs and outputs can
be sampled by loading the boundary scan register using the Capture-DR state. The sampled
values can then be viewed by shifting the boundary scan register using the Shift-DR state.
IDCODE
The identification instruction is used to connect the identification register between TDI and
TDO. The device's identification code can then be shifted out using the Shift-DR state.
STCTEST
The single transport chain instruction is used to test out the TAP controller and the boundary
scan register during production test. When this instruction is the current instruction, the
boundary scan register is connected between TDI and TDO. During the Capture-DR state, the
device identification code is loaded into the boundary scan register. The code can then be
shifted out output, TDO using the Shift-DR state.
Proprietary and Confidential to PMC-Sierra, Inc., and for its customers’ internal use.
Document No.: PMC-2020889, Issue 2
90
PMC [ PMC-SIERRA, INC ]
