S/UNI-IMA-4 Telecom Standard Product Data Sheet
Released
9.9 JTAG & Scan Interface (7 Signals)
Pin Name Type
Pin
Function
No.
The Test Clock (TCK) signal provides timing for test operations that
TCK
TMS
Input
Input
B21
A21
are carried out using the IEEE P1149.1 test access port.
The Test Mode Select (TMS) is an active high signal that controls
the test operations carried out using the IEEE P1149.1 test access
port.
The TMS signal has an internal pull-up resistor.
The TMS input is sampled on the rising edge of TCK.
The Test Data Input (TDI) signal carries test data into the S/UNI-
TDI
Input
B20
B19
IMA-4 via the IEEE P1149.1 test access port.
The TDI signal has an internal pull-up resistor.
The TDI input is sampled on the rising edge of TCK.
The Test Data Output (TDO) signal carries test data out of the
S/UNI-IMA-4 via the IEEE P1149.1 test access port. TDO is a
tristate output that is inactive except when the scanning of data is in
progress.
TDO
Tristate
The TDO output is updated/tristated on the falling edge of TCK.
The Active low Test Reset (TRSTB) is an active low signal that
provides an asynchronous S/UNI-IMA-4 test access port reset via
the IEEE P1149.1 test access port. TRSTB is a Schmitt-triggered
input with an internal pull-up resistor.
TRSTB
Input
C18
Note that when not being used, TRSTB must be connected to the
RSTB input.
The Active low Scan Mode (SCAN_MODEB) is an active low
signal that places the S/UNI-IMA-4 into a manufacturing test mode.
Must be tied high to disable the scan logic.
The Active low Scan Enable (SCANENB) is an active low signal
that enables the internal scan logic for production testing. Must be
tied high to disable the scan logic.
SCAN_MO
DEB
Input
Input
D7
A8
SCANENB
9.10 Power (120 Signals)
Pin Name
Type
Pin No.
Function
VDDI (1.8 V) Power
E4
The core power pins (VDDI[7:0]) should be connected to a
U4
well-decoupled +1.8 V DC supply.
AA11
W17
U20
M21
C14
A7
Proprietary and Confidential to PMC-Sierra, Inc., and for its customers’ internal use.
Document No.: PMC-2020889, Issue 2
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