Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Vdc
Vdc
Vdc
C
Drain--Source Voltage
V
–0.5, +105
–6.0, +10
55, +0
DSS
Gate--Source Voltage
V
GS
DD
Operating Voltage
V
Storage Temperature Range
Case Operating Temperature Range
T
stg
–65 to +150
–40 to +150
–40 to +225
T
C
C
(1,2)
Operating Junction Temperature Range
T
J
C
Table 2. Thermal Characteristics
(2,3)
Characteristic
Symbol
Value
Unit
Thermal Resistance, Junction to Case
R
0.37
C/W
JC
Case Temperature 77C, 120 W Avg., W--CDMA, 48 Vdc, I
= 700 mA,
DQA
V
= 0.5 Vdc, 623 MHz
GSB
Table 3. ESD Protection Characteristics
Test Methodology
Class
2
Human Body Model (per JESD22--A114)
Charge Device Model (per JESD22--C101)
C3
Table 4. Moisture Sensitivity Level
Test Methodology
Rating
Package Peak Temperature
Unit
Per JESD22--A113, IPC/JEDEC J--STD--020
3
260
C
Table 5. Electrical Characteristics (T = 25C unless otherwise noted)
A
Characteristic
Symbol
Min
Typ
Max
Unit
(4)
Off Characteristics
Zero Gate Voltage Drain Leakage Current
I
I
—
—
—
—
—
—
10
1
Adc
Adc
Adc
DSS
DSS
GSS
(V = 105 Vdc, V = 0 Vdc)
DS
GS
Zero Gate Voltage Drain Leakage Current
(V = 55 Vdc, V = 0 Vdc)
DS
GS
Gate--Source Leakage Current
(V = 5 Vdc, V = 0 Vdc)
I
1
GS
DS
On Characteristics -- Side A, Carrier
Gate Threshold Voltage
V
1.3
2.0
0.1
1.8
2.5
2.3
3.3
0.5
Vdc
Vdc
Vdc
GS(th)
(V = 10 Vdc, I = 140 Adc)
DS
D
Gate Quiescent Voltage
(V = 48 Vdc, I = 700 mAdc, Measured in Functional Test)
V
GSA(Q)
DD
DA
Drain--Source On--Voltage
(V = 10 Vdc, I = 1.4 Adc)
V
0.21
DS(on)
GS
D
On Characteristics -- Side B, Peaking
Gate Threshold Voltage
V
1.3
0.1
1.8
2.3
0.5
Vdc
Vdc
GS(th)
(V = 10 Vdc, I = 280 Adc)
DS
D
Drain--Source On--Voltage
(V = 10 Vdc, I = 2.8 Adc)
V
0.21
DS(on)
GS
D
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.nxp.com/RF/calculators.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.
4. Each side of device measured separately.
(continued)
A2V07H525--04NR6
RF Device Data
NXP Semiconductors
2