512Mb, Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Table 23: Serial Flash Discovery Parameter Data Structure
Compliant with JEDEC standard JC-42.4 1775.03
Address
Description
(Byte Mode)
Address (Bit)
7:0
Data
53h
46h
44h
50h
00h
01h
00h
FFh
00h
00h
01h
09h
30h
00h
00h
FFh
Serial Flash discoverable parameters signature
00h
01h
02h
03h
04h
05h
06h
07h
08h
09h
0Ah
0Bh
0Ch
0Dh
0Eh
0Fh
15:08
23:16
31:24
7:0
Serial Flash discoverable parameters
Minor revision
Major revision
15:8
Number of parameter headers
Reserved
7:0
15:8
Parameter ID (0) JEDEC-defined parameter table
7:0
Parameter
Minor revision
Major revision
15:8
23:16
31:24
7:0
Parameter length (DW)
Parameter table pointer
15:8
23:16
31:24
Reserved
Table 24: Parameter ID
Byte
Address
512Mb
Data
Description
Bits
1:0
2
Minimum block/sector erase sizes
Write granularity
30h
01b
1
WRITE ENABLE command required for writing to volatile status reg-
isters
3
0
WRITE ENABLE command selected for writing to volatile status regis-
ters
4
0
Reserved
7:5
7:0
111b
20h
4KB ERASE command
31h
PDF: 09005aef84752721
n25q_512mb_1ce_3V_65nm.pdf - Rev. O 05/13 EN
Micron Technology, Inc. reserves the right to change products or specifications without notice.
41
© 2011 Micron Technology, Inc. All rights reserved.