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MT41J256M4 参数 Datasheet PDF下载

MT41J256M4图片预览
型号: MT41J256M4
PDF下载: 下载PDF文件 查看货源
内容描述: DDR3 SDRAM MT41J256M4 â ????梅格32 ×4× 8银行MT41J128M8 â ????梅格16 ×8× 8银行MT41J64M16 â ???? 8梅格×16× 8银行 [DDR3 SDRAM MT41J256M4 – 32 Meg x 4 x 8 banks MT41J128M8 – 16 Meg x 8 x 8 banks MT41J64M16 – 8 Meg x 16 x 8 banks]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 214 页 / 2938 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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1Gb: x4, x8, x16 DDR3 SDRAM  
Mode Register 1 (MR1)  
share the same ball. When the TDQS function is enabled via the mode register, the DM  
function is not supported. When the TDQS function is disabled, the DM function is pro-  
vided, and the TDQS# ball is not used. The TDQS function is available in the x8 DDR3  
SDRAM configuration only and must be disabled via the mode register for the x4 and  
x16 configurations.  
On-Die Termination  
ODT resistance RTT,nom is defined by MR1[9, 6, 2] (see Figure 55 (page 141)). The RTT  
termination value applies to the DQ, DM, DQS, DQS#, and TDQS, TDQS# balls. DDR3  
supports multiple RTT termination values based on RZQ/n where n can be 2, 4, 6, 8, or  
12 and RZQ is 24±Ω  
Unlike DDR2, DDR3 ODT must be turned off prior to reading data out and must remain  
off during a READ burst. RTT,nom termination is allowed any time after the DRAM is ini-  
tialized, calibrated, and not performing read access, or when it is not in self refresh  
mode. Additionally, write accesses with dynamic ODT enabled (RTT(WR)) temporarily re-  
places RTT,nom with RTT(WR)  
.
The actual effective termination, RTT(EFF), may be different from the RTT targeted due to  
nonlinearity of the termination. For RTT(EFF) values and calculations (see On-Die Termi-  
nation (ODT) (page 193)).  
The ODT feature is designed to improve signal integrity of the memory channel by ena-  
bling the DDR3 SDRAM controller to independently turn on/off ODT for any or all devi-  
ces. The ODT input control pin is used to determine when RTT is turned on (ODTL on)  
and off (ODTL off), assuming ODT has been enabled via MR1[9, 6, 2].  
Timings for ODT are detailed in On-Die Termination (ODT) (page 193).  
WRITE LEVELING  
The WRITE LEVELING function is enabled by MR1[0], as shown in Figure 55 (page 141).  
Write leveling is used (during initialization) to deskew the DQS strobe to clock offset as  
a result of fly-by topology designs. For better signal integrity, DDR3 SDRAM memory  
modules adopted fly-by topology for the commands, addresses, control signals, and  
clocks.  
The fly-by topology benefits from a reduced number of stubs and their lengths. Howev-  
er, fly-by topology induces flight time skews between the clock and DQS strobe (and  
DQ) at each DRAM on the DIMM. Controllers will have a difficult time maintaining  
tDQSS, tDSS, and tDSH specifications without supporting write leveling in systems  
which use fly-by topology-based modules. Write leveling timing and detailed operation  
information is provided in Write Leveling (page 129).  
POSTED CAS ADDITIVE Latency  
POSTED CAS ADDITIVE latency (AL) is supported to make the command and data bus  
efficient for sustainable bandwidths in DDR3 SDRAM. MR1[4, 3] define the value of AL,  
as shown in Figure 56 (page 144). MR1[4, 3] enable the user to program the DDR3  
SDRAM with AL = ±, CL - 1, or CL - 2.  
With this feature, the DDR3 SDRAM enables a READ or WRITE command to be issued  
after the ACTIVATE command for that bank prior to tRCD (MIN). The only restriction is  
ACTIVATE to READ or WRITE + AL tRCD (MIN) must be satisfied. Assuming tRCD  
(MIN) = CL, a typical application using this feature sets AL = CL - 1tCK = tRCD (MIN) - 1  
PDF: 09005aef826aa906  
1Gb_DDR3_SDRAM.pdf - Rev. L 03/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
143  
‹ 2006 Micron Technology, Inc. All rights reserved.  
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