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JS28F640J3F75A 参数 Datasheet PDF下载

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型号: JS28F640J3F75A
PDF下载: 下载PDF文件 查看货源
内容描述: Numonyx®嵌入式闪存( J3 65 nm)的单细胞每比特( SBC ) [Numonyx® Embedded Flash Memory (J3 65 nm) Single Bit per Cell (SBC)]
分类和应用: 闪存
文件页数/大小: 66 页 / 2203 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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Numonyx® Embedded Flash Memory (J3 65 nm) Single Bit per Cell (SBC)  
Table 12: Write Operations  
Valid for All  
Speeds  
#
Symbol  
Parameter  
Density  
Unit  
Notes  
Min  
Max  
32 Mbit  
64 Mbit  
128 Mbit  
150  
180  
210  
0
500  
W1  
t
t
PHWL (tPHEL  
)
RP# High Recovery to WE# (CEX) Going Low  
1,2,3,4  
W2  
W3  
ELWL (tWLEL  
)
CEX (WE#) Low to WE# (CEX) Going Low  
Write Pulse Width  
1,2,3,5  
1,2,3,5  
1,2,3,6  
1,2,3,6  
1,2,3  
tWP  
60  
50  
55  
0
W4  
tDVWH (tDVEH  
)
Data Setup to WE# (CEX) Going High  
Address Setup to WE# (CEX) Going High  
CEX (WE#) Hold from WE# (CEX) High  
Data Hold from WE# (CEX) High  
Address Hold from WE# (CEX) High  
Write Pulse Width High  
W5  
tAVWH (tAVEH  
)
W6  
tWHEH (tEHWH  
tWHDX (tEHDX  
)
ns  
W7  
)
0
1,2,3  
All  
W8  
t
WHAX (tEHAX  
tWPH  
VPWH (tVPEH  
WHGL (tEHGL  
)
0
1,2,3  
W9  
30  
0
1,2,3,7  
1,2,3,4  
1,2,3,8  
1,2,3,9  
W11  
W12  
W13  
t
)
)
VPEN Setup to WE# (CEX) Going High  
Write Recovery before Read  
t
35  
tWHRL (tEHRL  
)
WE# (CEX) High to STS Going Low  
1,2,3,4,  
9,10  
W15  
tQVVL  
VPEN Hold from Valid SRD, STS Going High  
0
Notes:  
1.  
CE low is defined as the combination of pins CE0, CE1, and CE2 that enable the device. CE high is defined as the  
X X  
combination of pins CE0, CE1, and CE2 that disable the device (see Table 17, “Chip Enable Truth Table for  
32-, 64-, 128-Mb” on page 30).  
2.  
Read timing characteristics during block erase, program, and lock-bit configuration operations are the same as during  
read-only operations. Refer to AC Characteristics–Read-Only Operations.  
3.  
4.  
5.  
A write operation can be initiated and terminated with either CEX or WE#.  
Sampled, not 100% tested.  
Write pulse width (tWP) is defined from CEX or WE# going low (whichever goes low last) to CEX or WE# going high  
(whichever goes high first). Hence, tWP = tWLWH = tELEH = tWLEH = tELWH  
.
6.  
7.  
Refer to Table 18, “Enhanced Configuration Register” on page 32 for valid AIN and DIN for block erase,  
program, or lock-bit configuration.  
Write pulse width high (tWPH) is defined from CEX or WE# going high (whichever goes high first) to CEX or WE# going  
low (whichever goes low first). Hence, tWPH = tWHWL = tEHEL = tWHEL = tEHWL  
.
8.  
9.  
10.  
For array access, tAVQV is required in addition to tWHGL for any accesses after a write.  
STS timings are based on STS configured in its RY/BY# default mode.  
VPEN should be held at VPENH until determination of block erase, program, or lock-bit configuration success (SR[5:3,1]  
= 0).  
Datasheet  
26  
Jan 2011  
208032-03  
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