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JS28F128P30TF75A 参数 Datasheet PDF下载

JS28F128P30TF75A图片预览
型号: JS28F128P30TF75A
PDF下载: 下载PDF文件 查看货源
内容描述: 恒忆Axcell P30-65nm闪存 [Numonyx Axcell P30-65nm Flash Memory]
分类和应用: 闪存
文件页数/大小: 90 页 / 1194 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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P30-65nm SBC  
15.0  
AC Characteristics  
15.1  
AC Test Conditions  
Figure 16: AC Input/Output Reference Waveform  
VCCQ  
Input VCCQ/2  
Test Points  
VCCQ/2 Output  
0V  
IO_REF.WMF  
Note: AC test inputs are driven at VCCQ for Logic "1" and 0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input  
rise and fall times (10% to 90%) < 5ns. Worst case speed occurs at V = VCCMin.  
CC  
Figure 17: Transient Equivalent Testing Load Circuit  
Device  
Under Test  
Out  
CL  
Notes:  
1.  
2.  
See the following table for component values.  
Test configuration component value for worst case speed conditions.  
3.  
C includes jig capacitance  
L
.
Table 23: Test Configuration Component Value for Worst Case Speed Conditions  
Test Configuration  
VCCQ Min Standard Test  
C
(pF)  
L
30  
Datasheet  
48  
Apr 2010  
Order Number: 208033-02