E
BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY
(1)
6.5
AC Characteristics—Read-Only Operations —Commercial Temperature
TA = 0°C to +70°C
5 V ± 5% VCC
5 V ± 10% VCC
3.3 V ± 0.3 V VCC
2.7 V−3.6 V VCC
-85/-95(5)
Versions(4)
-90/-100(6)
-120
-120
Unit
-150
-150
-170
#
Sym
Parameter
Notes Min Max Min Max Min Max Min Max Min Max
85
95
90
120
120
R1 tAVAV Read Cycle
Time
4, 8 Mbit
16 Mbit
150
150
170
170
ns
ns
100
85
95
90
100
90
120
120
120
120
50
R2 tAVQV Address to
4, 8 Mbit
150
150
150
150
55
170 ns
170 ns
170 ns
170 ns
55 ns
600 ns
Output Delay 16 Mbit
85
R3 tELQV CE# to Output 4, 8 Mbit
2
2
2
95
100
45
Delay
16 Mbit
40
R4 tGLQV OE# to Output Delay
400
400
400/
R5 tPHQV RP# High to Output
Delay
600
(7)
600
0
0
0
0
0
0
R6 tELQX CE# to Output in Low Z
R7 tGLQX OE# to Output in Low Z
3
3
3
0
0
0
0
ns
ns
55
10
55
10
55
15
R8 tEHQZ CE# High to Output in
High Z
55
20
55 ns
R9 tGHQZ OE# High to Output in
High Z
3
3
25 ns
ns
0
0
0
R10 tOH
Output Hold from
Address, CE# or OE#
Change, Whichever
Occurs First
0
0
NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV–tGLQV after the falling edge of CE# without impact on tELQV
.
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration)
for testing characteristics.
7. Valid for 3.3 V V
read operations.
CC
35
PRELIMINARY
INTEL [ INTEL ]
