Registers
14.5.2.6
MBLFSRSED: Memory Test Circular Shift and LFSR Seed
Device:
NodeID
Function: 3
Offset:
A4h
Bit
Attr
Default
Description
31:0
RWST
0000h DMBLFSRSED:MemBIST LFSR Seed
This 32 bit register will be used as the initial data seed for LFSR or Circular shift
data pattern.
14.5.2.7
MBFADDRPTR: Memory Test failure Address Pointer Register
Device:
NodeID
Function: 3
Offset:
A8h
Bit
Attr
Default
Description
31:0
RWST
0000h DMBFADDRPTR: This 32 bit register designates which MemBIST failures to log in
the available failure address locations.
The default value of this register is zero. It means MemBIST always logs beginning
with the first failure. If it is programmed to hex A (10 in decimal), MemBIST will log
failures starting from the11th failure.
The corresponding MB_ERR_DATA0 register will log corrupted data in the first
designated failure address.
Note: this register does not affect the MBDATA failure bit location accumulators.
14.5.2.8
MB_ERR_DATA00: Memory Test Error Data 0 Bytes [3:0]
Stores the first 32 bits of the 1st 144 bit failure data Research: compare all
register[definitions to table.]
Device:
NodeID
Function: 3
Offset:
B0h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Early failure data [31:0]
14.5.2.9
MB_ERR_DATA01: Memory Test Error Data 0 Bytes [7:4]
Stores the second 32 bits of the 1st 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
B4h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Early failure data [63:32]
Intel® 6400/6402 Advanced Memory Buffer Datasheet
197
INTEL [ INTEL ]
