Registers
14.5.2.26 MB_ERR_DATA33: Memory Test Error Data 3 Bytes [15:12]
Stores the fourth 32 bits of the 4th 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
F8h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Late failure data [63:32]
14.5.2.27 MB_ERR_DATA34: Memory Test Error Data 3 Bytes [17:16]
Stores the last 16 bits of the 4th 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
FCh
Bit
Attr
Default
Description
15:0
RWST
0000h DATA: Late failure data [71:64] & Early failure data [71:64]
14.5.3
Thermal Sensor Registers
14.5.3.1
TEMPLO: Temperature Low Trip Point
Low trip point.
Device:
NodeID
Function: 3
Offset:
80h
Bit
Attr
Default
Description
Description
Description
7:0
RWST
FFh
TEMPLO: Low threshold trip point
14.5.3.2
TEMPMID: Temperature Mid Trip Point
Mid trip point.
Device:
Function: 3
Offset:
NodeID
81h
Bit
Attr
Default
7:0
RWST
FFh
TEMPMID: Mid threshold trip point
14.5.3.3
TEMPHI: Temperature High Trip Point
High trip point.
Device:
Function: 3
Offset:
NodeID
82h
Bit
Attr
Default
7:0
RWST
FFh
TEMPHI: High threshold trip point
Intel® 6400/6402 Advanced Memory Buffer Datasheet
201
INTEL [ INTEL ]
