Registers
14.5.2.20 MB_ERR_DATA22: Memory Test Error Data 2 Bytes [11:8]
Stores the third 32 bits of the 3rd 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
E0h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Late failure data [31:0]
14.5.2.21 MB_ERR_DATA23: Memory Test Error Data 2 Bytes [15:12]
Stores the fourth 32 bits of the 3rd 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
E4h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Late failure data [63:32]
14.5.2.22 MB_ERR_DATA24: Memory Test Error Data 2 Bytes [17:16]
Stores the last 16 bits of the 3rd 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
E8h
Bit
Attr
Default
Description
15:0
RWST
0000h DATA: Late failure data [71:64] & Early failure data [71:64]
14.5.2.23 MB_ERR_DATA30: Memory Test Error Data 3 Bytes [3:0]
Stores the first 32 bits of the 4th 144 bit failure data.
14.5.2.24 MB_ERR_DATA31: Memory Test Error Data 3 Bytes [7:4]
Stores the second 32 bits of the 4th 144 bit failure data
Device:
NodeID
Function: 3
Offset:
F0h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Early failure data [63:32]
14.5.2.25 MB_ERR_DATA32: Memory Test Error Data 3 Bytes [11:8]
Stores the third 32 bits of the 4th 144 bit failure data.
Device:
NodeID
Function: 3
Offset:
F4h
Bit
Attr
Default
Description
31:0
RWST
0000h DATA: Late failure data [31:0]
200
Intel® 6400/6402 Advanced Memory Buffer Datasheet
INTEL [ INTEL ]
