TLE9879QXA40
Application Information
28.2
ESD Immunity According to IEC61000-4-2
Note:Tests for ESD immunity according to IEC61000-4-2 “Gun test” (150pF, 330Ω) has been performed. The
results and test condition will be available in a test report.
Table 16
ESD “Gun Test”
Performed Test
Result
Unit
Remarks
ESD at pin LIN, versus
GND1)
> 6
kV
2)positive pulse
ESD at pin LIN, versus
GND1)
< -6
kV
2)negative pulse
1) ESD test “ESD GUN” is specified with external components; see application diagram:
MON = 100nF, RMON = 1kΩ, CLIN = 220pF, CVS = >20µF ELCO + 100nF ESR < 1Ω, CVSD = 1µF, RVSD = 2Ω.
C
2) ESD susceptibility “ESD GUN” according to LIN EMC Test Specification, Section 4.3 (IEC 61000-4-2). To be tested by
external test house (IBEE Zwickau)
Data Sheet
79
Rev. 1.0, 2015-04-30
INFINEON [ Infineon ]
