OPTIREG™ SBC TLE9274QXV33
Application information
15.3
ESD tests
Note: Tests for ESD robustness according to IEC61000-4-2 “gun test” (150pF, 330Ω) have been performed. The
results and test condition are available in a test report. The minimum values for the test are listed in
Table 26 below.
Table 26 ESD “Gun Test”
Performed test
Result
Unit
Remarks
1)2) positive pulse
ESD at pin CANH, CANL,
LIN, versus GND
>6
kV
ESD at pin CANH, CANL,
LIN, versus GND
< -6
kV
1)2) negative pulse
1) ESD susceptibility “ESD GUN” according to LIN EMC 1.3 Test Specification, Section 4.3 (IEC 61000-4-2). Tested by
external test house (IBEE, EMC Test report Nr. 01-03-17).
2) ESD Test “Gun Test” is specified with external components for pins VS, WK, BKSW, VCC2. Refer to application diagram
in Chapter 15.2 for more information.
EMC and ESD susceptibility tests according to SAE J2962-2 (2010) have been performed. Tested by external
test house (UL LLC, Test report Nr. 2017-327).
Datasheet
125
Rev.2.0
2022-05-06
INFINEON [ Infineon ]
