IDT70V5388/78
3.3V 64/32K x 18 Synchronous FourPort™ Static RAM
Industrial and Commercial Temperature Ranges
Identification Register Definitions
Instruction Field
Value
Description
Revision Number (31:28)
0x0
Reserved for version number
0x31D(1)
0x33
1
IDT Device ID (27:12)
Defines IDT part number
IDT JEDEC ID (11:1)
Allows unique identification of device vendor as IDT
Indicates the presence of an ID register
ID Register Indicator Bit (Bit 0)
5649 tbl 15
NOTE:
1. Device ID for IDT70V5378 is 0x31E.
ScanRegisterSizes
Register Name
Bit Size
Instruction (IR)
4
MBIST Mode Select Register (MSR)
Bypass (BYR)
2
1
Identification (IDR)
32
392 Note (3)
26
Boundary Scan (BSR)
MBIST Result (MRR)
5649 tbl 16
SystemInterfaceParameters
Instruction
Code
0000
Description
EXTEST
Forces contents of the boundary scan cells onto the device outputs(1).
Places the boundary scan register (BSR) between TDI and TDO.
BYPASS
IDCODE
1111
0111
Places the bypass register (BYR) between TDI and TDO.
Loads the ID register (IDR) with the vendor ID code and places the
register between TDI and TDO.
0110
0001
Places the bypass register (BYR) between TDI and TDO. Forces all
device output drivers to a High-Z state.
HIGHZ
SAMPLE/PRELOAD
Places the boundary scan register (BSR) between TDI and TDO.
SAMPLE allows data from device inputs(2) to be captured in the
boundary scan cells and shifted serially through TDO. PRELOAD allows
data to be input serially into the boundary scan cells via the TDI.
Places the MBIST Mode Register between TDI and TDO. A value of '00'
written into this register will allow MBIST to run in standard memory test
mode, outputting valid results as appropriate via the MBIST Result
Register. A value of '11' written into the MBIST Mode Register will force
the MBIST Result Register (MRR) to report a result of 'FAIL'., with 8E0000
failed read cycles noted (i.e., the MRR content = (8E0000h, 0, x). The
value of the MBIST Mode Register is not guaranteed at power-up and is
not affected by Master reset and JTAG reset.
MBIST_MODE_SELECT
1010
1000
Invokes MBIST. Internally updates MBIST result register with Go-NoGo
information and number of issues. PROGRAM_MBIST_MODE_REGISTER
must be run prior to executing RUNBIST in order to ensure valid results.
There is no need to repeat this instruction unless the mode of operation
is changed: the MMR will retain its programmed value until overwritten or
the device is powered down.
RUNBIST
Scans out partial information. Places MBIST result register (MRR)
between TDI & TDO.
INT_SCAN
CLAMP
0100
0101
Uses BYR. Forces contents of the boundary scan cells onto the device
outputs. Places the Bypass register (BYR) between TDI & TDO.
Several combinations are reserved. Do not use codes other than those
identified above.
RESERVED
PRIVATE
0010, 0011
Several combinations arePRIVATE (for IDT internal use). Do not use
codes other than those identified above.
1001, 1011, 1100, 1101, 1110
5649 tbl 17
NOTES:
1. Device outputs = All device outputs except TDO.
2. Device inputs = All device inputs except TDI, TMS, and TRST.
3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local
IDT sales representative.
28
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
