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MC9S12P64CFT 参数 Datasheet PDF下载

MC9S12P64CFT图片预览
型号: MC9S12P64CFT
PDF下载: 下载PDF文件 查看货源
内容描述: 微控制器 [Microcontrollers]
分类和应用: 微控制器外围集成电路时钟
文件页数/大小: 566 页 / 7414 K
品牌: FREESCALE [ Freescale ]
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Electrical Characteristics  
NOTE  
All values shown in Table A-19 are preliminary and subject to further  
characterization.  
Table A-19. NVM Reliability Characteristics  
Conditions are shown in Table A-4 unless otherwise noted  
Num  
C
Rating  
Symbol  
Min  
Typ  
Max  
Unit  
Program Flash Arrays  
1
2
C Data retention at an average junction temperature of TJavg  
=
tNVMRET  
nFLPE  
20  
100(2)  
Years  
85°C(1) after up to 10,000 program/erase cycles  
C Program Flash number of program/erase cycles  
10K 100K(3)  
Cycles  
(-40°C tj 150°C)  
Data Flash Array  
3
4
5
6
C Data retention at an average junction temperature of TJavg  
=
=
=
tNVMRET  
tNVMRET  
tNVMRET  
nFLPE  
5
1002  
1002  
Years  
Years  
Years  
Cycles  
85°C1 after up to 50,000 program/erase cycles  
C Data retention at an average junction temperature of TJavg  
10  
85°C1 after up to 10,000 program/erase cycles  
C Data retention at an average junction temperature of TJavg  
20  
1002  
85°C1 after less than 100 program/erase cycles  
C Data Flash number of program/erase cycles (-40°C tj 150°C)  
50K  
500K3  
1. TJavg does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive  
application.  
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated  
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please  
refer to Engineering Bulletin EB618  
3. Spec table quotes typical endurance evaluated at 25°C for this product family. For additional information on how Freescale  
defines Typical Endurance, please refer to Engineering Bulletin EB619.  
A.4  
Phase Locked Loop  
Jitter Definitions  
A.4.1  
With each transition of the feedback clock, the deviation from the reference clock is measured and input  
voltage to the VCO is adjusted accordingly.The adjustment is done continuously with no abrupt changes  
in the VCOCLK frequency. Noise, voltage, temperature and other factors cause slight variations in the  
control loop resulting in a clock jitter. This jitter affects the real minimum and maximum clock periods as  
illustrated in Figure A-2.  
S12P-Family Reference Manual, Rev. 1.13  
Freescale Semiconductor  
523  
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