AS4LC1M16 883C
1 MEG x 16 DRAM
AUSTIN SEMICONDUCTOR, INC.
PRELIMINARY
ELECTRICAL TEST REQUIREMENTS
SUBGROUPS
MIL-STD-883TESTREQUIREMENTS
(perMethod5005, Table I)
INTERIM ELECTRICAL (PRE-BURN-IN) TEST PARAMETERS
(Method 5004)
2, 8A, 10
FINAL ELECTRICAL TEST PARAMETERS
(Method 5004)
1*, 2, 3, 7*, 8, 9, 10, 11
1, 2, 3, 4**, 7, 8, 9, 10, 11
1, 2, 3, 7, 8, 9, 10, 11
GROUP A TEST REQUIREMENTS
(Method 5005)
GROUP C AND D END-POINT ELECTRICAL PARAMETERS
(Method 5005)
*
PDA applies to subgroups 1 and 7.
** Subgroup 4 shall be measured only for initial qualification and after process or design changes, which may affect input
or output capacitance.
AS4LC1M16
REV. 3/97
DS000020
Austin Semiconductor, Inc., reserves the right to change products or specifications without notice.
2-113
AUSTIN [ AUSTIN SEMICONDUCTOR ]
