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EP1AGX50DF780C6 参数 Datasheet PDF下载

EP1AGX50DF780C6图片预览
型号: EP1AGX50DF780C6
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 50160 CLBs, 640MHz, PBGA780, 29 X 29 MM, 1 MM PITCH, FBGA-780]
分类和应用: 现场可编程门阵列可编程逻辑LTE时钟
文件页数/大小: 296 页 / 3505 K
品牌: ALTERA [ ALTERA CORPORATION ]
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I/O Timing Model  
Table 4–44. Output Timing Measurement Methodology for Output Pins Notes (1), (2), (3) (Part 2 of 2)  
Measurement  
Loading and Termination  
RD (Ω) RT (Ω) VCCIO (V) VTT (V) CL (pF)  
Point  
I/O Standard  
RS (Ω)  
VMEAS (V)  
Differential SSTL-2 Class II  
Differential SSTL-18 Class I  
Differential SSTL-18 Class II  
1.5-V differential HSTL Class I  
1.5-V differential HSTL Class II  
1.8-V differential HSTL Class I  
1.8-V differential HSTL Class II  
LVDS  
25  
50  
25  
25  
50  
25  
50  
25  
50  
25  
2.325  
1.660  
1.660  
1.375  
1.375  
1.660  
1.660  
2.325  
3.135  
1.123  
0.790  
0.790  
0.648  
0.648  
0.790  
0.790  
0
0
0
0
0
0
0
0
0
1.1625  
0.83  
0.83  
0.6875  
0.6875  
0.83  
0.83  
100  
100  
1.1625  
1.5675  
LVPECL  
Notes to Table 4–44:  
(1) Input measurement point at internal node is 0.5 VCCINT  
.
(2) Output measuring point for VMEAS at buffer output is 0.5 VCCIO  
.
(3) Input stimulus edge rate is 0 to VCC in 0.2 ns (internal signal) from the driver preceding the I/O buffer.  
(4) Less than 50-mV ripple on VCCIO and VCCPD, VCCINT = 1.15 V with less than 30-mV ripple.  
(5) VCCPD = 2.97 V, less than 50-mV ripple on VCCIO and VCCPD, VCCINT = 1.15 V.  
4–38  
Altera Corporation  
May 2008  
Arria GX Device Handbook, Volume 1  
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