AD9650
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter
Electrical
AVDD to AGND
DRVDD to AGND
VIN+A/VIN+B, VIN−A/VIN−B to AGND
CLK+, CLK− to AGND
SYNC to AGND
VREF to AGND
SENSE to AGND
VCM to AGND
RBIAS to AGND
CSB to AGND
SCLK/DFS to AGND
SDIO/DCS to AGND
OEB
PDWN
D0A/D0B Through D15A/D15B to
AGND
DCOA/DCOB to AGND
Environmental
Operating Temperature Range
(Ambient)
Maximum Junction Temperature
Under Bias
Storage Temperature Range
(Ambient)
1
THERMAL CHARACTERISTICS
Rating
−0.3 V to +2.0 V
−0.3 V to +2.0 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to AVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−0.3 V to DRVDD + 0.2 V
−40°C to +85°C
150°C
−65°C to +150°C
The exposed paddle must be soldered to the ground plane for
the LFCSP package. Soldering the exposed paddle to the PCB
increases the reliability of the solder joints and maximizes the
thermal capability of the package.
Typical θ
JA
is specified for a 4-layer PCB with a solid ground
plane. As shown in Table 7, airflow improves heat dissipation,
which reduces θ
JA
. In addition, metal in direct contact with the
package leads from metal traces, through holes, ground, and
power planes reduces θ
JA
.
Table 7. Thermal Resistance
Package Type
64-Lead LFCSP
(CP-64-6)
Airflow
Velocity (m/sec)
0
1.0
2.5
18.5
16.1
14.5
θ
1.0
θ
JB1, 4
9.2
Unit
°C/W
°C/W
°C/W
1
2
Per JEDEC 51-7, plus JEDEC 25-5 2S2P test board.
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-STD 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
ESD CAUTION
The inputs and outputs are rated to the supply voltage (AVDD or DRVDD) +
0.2 V but should not exceed 2.1 V.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rev. 0 | Page 10 of 44
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