CD-700, VCXO Based PLL
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional
operation is not implied at these or any other conditions in excess of conditions represented in the
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may
adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Power Supply
Storage Temperature
Symbol
VDD
Tstorage
Ratings
7
-55/125
Unit
Vdc
°C
Clock and Data Input Range
CLKIN, DATAIN
Gnd-0.5 to VDD +0.5
V
Reliability
The CD-700 is capable of meeting the the following qualification test.
Table 3. Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
Gross and Fine Leak
Resistance to Solvents
MIL-STD-883, Method 1014, 100% Tested
MIL-STD-883, Method 2016
Handling Precautions
Although ESD protection circuitry has been designed into the the CD-700, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model and a Charged-Device Model
(CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are dependent on
the circuit parameters used to define the model.
Table 4. Predicted ESD Ratings
Model
Human Body Model
Charged Device Model
Minimum
1500V
Conditions
MIL-STD 883, Method 3015
JESD 22-C101
1000 V
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