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OR2T26A-4BA208 参数 Datasheet PDF下载

OR2T26A-4BA208图片预览
型号: OR2T26A-4BA208
PDF下载: 下载PDF文件 查看货源
内容描述: 现场可编程门阵列 [Field-Programmable Gate Arrays]
分类和应用: 现场可编程门阵列
文件页数/大小: 192 页 / 2992 K
品牌: ETC [ ETC ]
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Data Sheet  
June 1999  
ORCA Series 2 FPGAs  
Special Function Blocks (continued)  
TCK  
TMS  
TDI  
Fig.5.3(F)  
Figure 52. Instruction Register Scan Timing Diagram  
Boundary-Scan Timing  
To ensure race-free operation, data changes on specific clock edges. The TMS and TDI inputs are clocked in on  
the rising edge of TCK, while changes on TDO occur on the falling edge of TCK. In the execution of an EXTEST  
instruction, parallel data is output from the BSR to the FPGA pads on the falling edge of TCK. The maximum fre-  
quency allowed for TCK is 10 MHz.  
Figure 52 shows timing waveforms for an instruction scan operation. The diagram shows the use of TMS to  
sequence the TAPC through states. The test host (or BSM) changes data on the falling edge of TCK, and it is  
clocked into the DUT on the rising edge.  
Lucent Technologies Inc.  
59  
 
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