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OR2T26A-4BA208 参数 Datasheet PDF下载

OR2T26A-4BA208图片预览
型号: OR2T26A-4BA208
PDF下载: 下载PDF文件 查看货源
内容描述: 现场可编程门阵列 [Field-Programmable Gate Arrays]
分类和应用: 现场可编程门阵列
文件页数/大小: 192 页 / 2992 K
品牌: ETC [ ETC ]
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Data Sheet  
June 1999  
ORCA Series 2 FPGAs  
The TAPC generates control signals which allow cap-  
ture, shift, and update operations on the instruction and  
data registers. In the capture operation, data is loaded  
into the register. In the shift operation, the captured  
data is shifted out while new data is shifted in. In the  
update operation, either the instruction register is  
loaded for instruction decode, or the boundary-scan  
register is updated for control of outputs.  
Special Function Blocks (continued)  
ORCA Series TAP Controller (TAPC)  
The ORCA Series TAP controller (TAPC) is a 1149.1  
compatible test access port controller. The 16 JTAG  
state assignments from the IEEE 1149.1 specification  
are used. The TAPC is controlled by TCK and TMS.  
The TAPC states are used for loading the IR to allow  
three basic functions in testing: providing test stimuli  
(Update-DR), test execution (Run-Test/Idle), and  
obtaining test responses (Capture-DR). The TAPC  
allows the test host to shift in and out both instructions  
and test data/results. The inputs and outputs of the  
TAPC are provided in the table below. The outputs are  
primarily the control signals to the instruction register  
and the data register.  
The test host generates a test by providing input into  
the ORCA Series TMS input synchronous with TCK.  
This sequences the TAPC through states in order to  
perform the desired function on the instruction register  
or a data register. Figure 50 provides a diagram of the  
state transitions for the TAPC. The next state is deter-  
mined by the TMS input value.  
TEST-LOGIC-  
RESET  
1
Table 13. TAP Controller Input/Outputs  
0
1
1
1
RUN-TEST/  
IDLE  
SELECT-  
DR-SCAN  
SELECT-  
IR-SCAN  
Symbol  
I/O  
Function  
Test Mode Select  
0
0
0
TMS  
TCK  
I
1
1
CAPTURE-DR  
0
CAPTURE-IR  
0
I
Test Clock  
0
0
SHIFT-DR  
1
SHIFT-IR  
1
0
0
PUR  
I
Powerup Reset  
1
1
PRGM  
I
BSCAN Reset  
EXIT1-DR  
0
EXIT1-IR  
0
TRESET  
Select  
O
O
O
O
O
O
O
O
O
Test Logic Reset  
PAUSE-DR  
PAUSE-IR  
Select IR (high); Select DR (low)  
Test Data Out Enable  
Capture/Parallel Load DR  
Capture/Parallel Load IR  
Shift Data Register  
1
EXIT2-DR  
1
1
EXIT2-IR  
1
0
0
Enable  
Capture-DR  
Capture-IR  
Shift-DR  
Shift-DR  
Update-DR  
Update-IR  
UPDATE-DR  
UPDATE-IR  
1
0
1
0
5-5370(F)  
Shift Instruction Register  
Update/Parallel Load DR  
Update/Parallel Load IR  
Figure 50. TAP Controller State Transition Diagram  
Lucent Technologies Inc.  
57  
 
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