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DS312_09 参数 Datasheet PDF下载

DS312_09图片预览
型号: DS312_09
PDF下载: 下载PDF文件 查看货源
内容描述: 的Spartan- 3E FPGA系列:介绍和订购信息 [Spartan-3E FPGA Family: Introduction and Ordering Information]
分类和应用:
文件页数/大小: 233 页 / 5527 K
品牌: XILINX [ XILINX, INC ]
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R
DC and Switching Characteristics  
Inputs and  
Table 95: Test Methods for Timing Measurement at I/Os (Continued)  
Inputs  
Outputs  
Outputs  
VM (V)  
VICM  
Signal Standard  
(IOSTANDARD)  
V
REF (V)  
VL (V)  
VH (V)  
RT (Ω)  
50  
VT (V)  
0.9  
DIFF_SSTL18_I  
-
-
VREF – 0.5  
VREF – 0.5  
VREF + 0.5  
VREF + 0.5  
DIFF_SSTL2_I  
50  
1.25  
VICM  
Notes:  
1. Descriptions of the relevant symbols are as follows:  
V
V
V
– The reference voltage for setting the input switching threshold  
– The common mode input voltage  
– Voltage of measurement point on signal transition  
REF  
ICM  
M
V – Low-level test voltage at Input pin  
L
V
– High-level test voltage at Input pin  
H
R – Effective termination resistance, which takes on a value of 1MΩ when no parallel termination is required  
T
V – Termination voltage  
T
2. The load capacitance (C ) at the Output pin is 0 pF for all signal standards.  
L
3. According to the PCI specification.  
The capacitive load (C ) is connected between the output  
and GND. The Output timing for all standards, as published  
models are found in the Xilinx development software as well  
as at the following link:  
L
in the speed files and the data sheet, is always based on a  
http://www.xilinx.com/support/download/index.htm  
C value of zero. High-impedance probes (less than 1 pF)  
L
Delays for a given application are simulated according to its  
specific load conditions as follows:  
are used for all measurements. Any delay that the test fix-  
ture might contribute to test measurements is subtracted  
from those measurements to produce the final timing num-  
bers as published in the speed files and data sheet.  
1. Simulate the desired signal standard with the output  
driver connected to the test setup shown in Figure 73.  
Use parameter values V , R , and V from Table 95.  
T
T
M
Using IBIS Models to Simulate Load  
Conditions in Application  
C
is zero.  
REF  
2. Record the time to V .  
M
IBIS models permit the most accurate prediction of timing  
delays for a given application. The parameters found in the  
3. Simulate the same signal standard with the output  
driver connected to the PCB trace with load. Use the  
IBIS model (V , R , and V ) correspond directly  
REF  
REF  
MEAS  
appropriate IBIS model (including V , R , C  
,
REF REF REF  
with the parameters used in Table 95 (V , R , and V ). Do  
T
T
M
and V  
load.  
values) or capacitive value to represent the  
MEAS  
not confuse V  
(the termination voltage) from the IBIS  
(the input-switching threshold) from the  
REF  
model with V  
REF  
4. Record the time to V  
.
MEAS  
table. A fourth parameter, C , is always zero. The four  
REF  
parameters describe all relevant output test conditions. IBIS  
5. Compare the results of steps 2 and 4. Add (or subtract)  
the increase (or decrease) in delay to (or from) the  
DS312-3 (v3.8) August 26, 2009  
www.xilinx.com  
135  
Product Specification  
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