TPS1HC100-Q1
ZHCSLK6A –JULY 2021 –REVISED DECEMBER 2021
www.ti.com.cn
表9-2. Tests
Test Items
Test Condition
Test Cycles
1M
1M
Cold repetitive short-circuit test –short pulse
Cold repetitive short-circuit test –long pulse
Hot repetitive short-circuit test
–40°C, 10-ms pulse, cool down
–40°C, 300-ms pulse, cool down
25°C, continuous short
1000 hr
Different grade levels are specified according to the pass cycles. The TPS1HC100-Q1device gets the
certification of Grade A level, 1 million short-to-GND cycles, which is the highest test standard in the market.
表9-3. Grade Levels
Grade
Number of Cycles
Lots,Samples Per Lot
Number of Fails
A
B
C
D
E
F
> 1000000
3, 10
3, 10
3, 10
3, 10
3, 10
3, 10
3, 10
3, 10
3, 10
0
0
0
0
0
0
0
0
0
> 300000 to 1000000
> 100000 to 300000
> 30000 to 100000
> 10000 to 30000
> 3000 to 10000
> 1000 to 3000
300 to 1000
G
H
O
< 300
9.2.2.3 EMC Transient Disturbances Test
Due to the severe electrical conditions in the automotive environment, immunity capacity against electrical
transient disturbances is required, especially for a high-side power switch, which is connected directly to the
battery. Detailed test requirements are in accordance with the ISO 7637-2:2011 and ISO 16750-2:2010
standards. The TPS1HC100-Q1 device is tested and certificated by a third-party organization.
表9-4. ISO 7637-2:2011(E) in 12-V System(1) (2) (3) (4)
Test Pulse Severity Level
and vs Accordingly
Minimum
Number of
Duration (td) Pulses or Test
Time
Burst-Cycle Pulse-
Repetition Time
Function
Performance
Status
Input
Resistance
(Ω)
Test
Item
Pulse
Level
Vs/V
MIN
MAX
Classification
1
III
III
IV
IV
IV
2 ms
50 µs
500 pulses
500 pulses
10 pulses
1h
0.5 s
0.2 s
e s
5 s
10
Status II
Status II
Status II
Status II
Status II
–112
55
2a
2b
3a
3b
2
0 to 0.05
50
10
0.2 to 2 s
0.1 µs
0.5 s
5 s
90 ms
90 ms
100 ms
100 ms
–220
150
0.1 µs
1h
50
(1) Tested both under input low condition and high condition.
(2) Considering the worst test condition, it is tested without any filter capacitors in VBB and VOUT
(3) GND pin network is a 1-kΩresistor in parallel with a diode BAS21-7-F.
(4) Status II: the function does not perform as designed during the test, but returns automatically to normal operation after the test.
表9-5. ISO 16750-2:2010(E) Load Dump Test B in 12-V System(1) (2) (3) (4) (5)
Test Pulse Severity Level
and vs Accordingly
Minimum
Number of
Pulses or Test
Time
Burst- Cycle Pulse-
Repetition Time
Function
Performance
Status
Input
Resistance
(Ω)
Test
Item
Pulse
Duration (td)
Level
Vs/V
MIN (s)
MAX (s)
Classification
Test B
35
40 to 400 ms
5 pulses
60
e
0.5 to 4
Status II
(1) Tested both under input low condition and high condition (DIAG_EN, EN, and VBB are all classified as inputs).
(2) Considering the worst test condition, the device is tested without any filter capacitors on VBB and VOUT.
(3) The GND pin network is a 1-kΩresistor in parallel with a diode BAS21-7-F.
(4) Status II: the function does not perform as designed during the test, but returns automatically to normal operation after the test.
(5) Select a 39-V external suppressor.
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