TPS1HC100-Q1
ZHCSLK6A –JULY 2021 –REVISED DECEMBER 2021
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VOUT (V)
VBB
VBB - VDS
Time (s)
Current (A)
IILIM2
IILIM1
INOM
dt
Time (s)
tSW
图9-3. Capacitive Charging Changing Current Limit
Alternatively, if the switch is open, the current limit starts out at a lower value and then the switch can be closed
when the capacitance gets charged up. This lower current limit level allows higher value capacitance’s to be
charged up. The timing diagram can be seen below.
VOUT (V)
VBB
VBB - VDS
Time (s)
Current (A)
IILIM2
INOM
IILIM1
dt
Time (s)
tSW
图9-4. Large Capacitive Charging Changing Current Limit
9.2.2.2 AEC Q100-012 Test Grade A Certification
Short-circuit reliability is critical for smart high-side power switch devices. The AEC-Q100-012 standard is used
to determine the reliability of the devices when operating in a continuous short-circuit condition. Different grade
levels are specified according to the pass cycles. This device is qualified with the highest level, Grade A, 1
million times short-to-GND certification.
Three test modes are defined in the AEC Q100-012 standard. See 表 9-2 for cold repetitive short-circuit test –
long pulse, cold repetitive short-circuit test –short pulse, and hot repetitive short-circuit test.
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