PGA281
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SBOS664A –MARCH 2013–REVISED JUNE 2013
ELECTRICAL CHARACTERISTICS
At TA = +25°C, VSP = +15 V, VSN = –15 V, VSON = 0 V, VSOP = 5 V, DVDD = +3 V, RL = 2.5 kΩ to VSOP / 2 = VOCM,
G = 1 V/V, VCM = 0 V, and differential output, unless otherwise noted.
PGA281
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INPUT
VOS
Offset voltage, RTI(1)
All gains
All gains
±(5 + 45/G)
±(20 + 235/G)
μV
±(0.03 +
0.18/G)
±(0.17 +
0.45/G)
dVOS/dT vs temperature(2)
μV/°C
VSP – VSN = 10 V and 36 V,
gain = 1 V/V, 128 V/V
PSR
vs power supply, RTI
±0.3
±3
μV/V
Long-term stability(3)
Input impedance
Gain = 128 V/V
3.5
>1
12
nV/month
Single-ended (SE) and differential
SE
GΩ
pF
V
Input capacitance
Input voltage range
TA = –40°C to +105°C
Gain = 1 V/V, TA = –40°C to +105°C
Gain = 128 V/V
(VSN) + 2.5
110
(VSP) – 2.5
130
142
140
dB
dB
dB
CMR
Common-mode rejection, RTI
121
Gain = 128 V/V, TA = –40°C to +105°C
116
(4)
SINGLE-ENDED OUTPUT CONNECTION
VOS Offset voltage, RTI, SE
Gain = 1 V/V, 1.375 V/V
±120
±3
μV
μV
Gain = 64 V/V
Gain = 1 V/V, TA = –40°C to +105°C
Gain = 64 V/V, TA = –40°C to +105°C
0.6
μV/°C
μV/°C
dVOS/dT vs temperature, SE
0.05
INPUT BIAS CURRENT(5)
Gain = 1 V/V
±0.3
±0.8
±1
±2
nA
nA
Gain = 128 V/V
IB
Bias current
Gain = 1 V/V, gain = 128 V/V,
TA = –40°C to +105°C
±0.6
±0.1
±0.9
±2
±0.5
±2
nA
nA
nA
Gain = 1 V/V, gain = 128 V/V
IOS
Offset current
Gain = 1 V/V, gain = 128 V/V,
TA = –40°C to +105°C
NOISE
f = 0.01 Hz to 10 Hz, gain = 128 V/V
f = 1 kHz, gain = 128 V/V
420
22
nVPP
nV/√Hz
μVPP
eNI
Voltage noise, RTI; target
Current noise, RTI
f = 0.01 Hz to 10 Hz, gain = 1 V/V
f = 1 kHz, gain = 1 V/V
4.5
240
1.7
90
nV/√Hz
pAPP
f = 0.01 Hz to 10 Hz, gain = 128 V/V
f = 1 kHz, gain = 128 V/V
IN
fA/√Hz
(1) RTI: Referred to input.
(2) Specified by design; not production tested.
(3) 300-hour life test at +150°C demonstrated randomly distributed variation in the range of measurement limits.
(4) For single-ended (SE) output mode, see Application Information section and Typical Characteristic graphs; signal between VOP and
VOCM.
(5) See Application Information section and Typical Characteristic graphs.
Copyright © 2013, Texas Instruments Incorporated
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