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MSP430F149IPMR 参数 Datasheet PDF下载

MSP430F149IPMR图片预览
型号: MSP430F149IPMR
PDF下载: 下载PDF文件 查看货源
内容描述: 混合信号微控制器 [MIXED SIGNAL MICROCONTROLLER]
分类和应用: 微控制器和处理器外围集成电路装置PC时钟
文件页数/大小: 65 页 / 1221 K
品牌: TI [ TEXAS INSTRUMENTS ]
 浏览型号MSP430F149IPMR的Datasheet PDF文件第33页浏览型号MSP430F149IPMR的Datasheet PDF文件第34页浏览型号MSP430F149IPMR的Datasheet PDF文件第35页浏览型号MSP430F149IPMR的Datasheet PDF文件第36页浏览型号MSP430F149IPMR的Datasheet PDF文件第38页浏览型号MSP430F149IPMR的Datasheet PDF文件第39页浏览型号MSP430F149IPMR的Datasheet PDF文件第40页浏览型号MSP430F149IPMR的Datasheet PDF文件第41页  
ꢀ ꢁꢂꢃ ꢄ ꢅ ꢆ ꢇ ꢄ ꢆ ꢈ ꢀ ꢁꢂꢃ ꢄ ꢅ ꢆ ꢇ ꢃ ꢆ ꢈ ꢀ ꢁꢂꢃ ꢄꢅ ꢆꢇꢃ ꢆꢇ  
ꢀ ꢉꢊꢋ ꢌ ꢁꢉ ꢍ ꢎꢏꢐ ꢀ ꢉꢑꢒꢓ ꢑꢓ ꢎꢔ ꢒꢓ ꢐꢐ ꢋꢒ  
SLAS272F − JULY 2000 − REVISED JUNE 2004  
electrical characteristics over recommended operating free-air temperature (unless otherwise  
noted) (continued)  
12-bit ADC, timing parameters  
PARAMETER  
TEST CONDITIONS  
MIN  
NOM  
MAX  
UNIT  
For specified performance of ADC12  
linearity parameters  
2.2V/  
3V  
f
f
0.45  
5
6.3  
MHz  
ADC12CLK  
Internal ADC12  
oscillator  
ADC12DIV=0,  
2.2 V/  
3V  
3.7  
6.3  
MHz  
µs  
ADC12OSC  
f
=f  
ADC12CLK ADC12OSC  
C
5 µF, Internal oscillator,  
2.2 V/  
3 V  
VREF+  
2.06  
3.51  
f
= 3.7 MHz to 6.3 MHz  
ADC12OSC  
t
Conversion time  
CONVERT  
External f  
ADC12SSEL 0  
from ACLK, MCLK or SMCLK:  
13×ADC12DIV×  
ADC12CLK  
µs  
1/f  
ADC12CLK  
Turn on settling time of  
the ADC  
t
t
(see Note 1)  
100  
ns  
ADC12ON  
R
= 400 , R = 1000 ,  
I
3 V  
1220  
1400  
S
I
Sampling time  
ns  
C = 30 pF  
τ = [R + R ] x C (see Note 2)  
I;  
Sample  
2.2 V  
S
I
Not production tested, limits characterized  
Not production tested, limits verified by design  
NOTES: 1. The condition is that the error in a conversion started after t  
settled.  
is less than 0.5 LSB. The reference and input signal are already  
ADC12ON  
2. Approximately ten Tau (τ) are needed to get an error of less than 0.5 LSB:  
n+1  
= ln(2  
t
) x (R + R ) x C + 800 ns where n = ADC resolution = 12, R = external source resistance.  
Sample  
S
I
I
S
12-bit ADC, linearity parameters  
PARAMETER  
TEST CONDITIONS  
/V ) min 1.6 V  
MIN NOM MAX  
UNIT  
1.4 V (V  
− V  
− V  
2
eREF+  
REF− eREF−  
/V  
E
E
Integral linearity error  
2.2 V/3 V  
2.2 V/3 V  
LSB  
I
1.6 V < (V  
) min [V  
]
1.7  
eREF+  
REF− eREF−  
(AVCC)  
Differential linearity  
error  
(V  
eREF+  
VREF+  
− V  
/V  
)
(V  
− V /V  
),  
REF− eREF− min  
eREF+  
= 10 µF (tantalum) and 100 nF (ceramic)  
REF− eREF−  
1
LSB  
LSB  
D
C
(V  
− V  
/V  
)
(V  
eREF+  
S
− V ),  
/V  
eREF+  
Internal impedance of source R < 100 ,  
REF− eREF− min  
REF− eREF−  
E
O
2.2 V/3 V  
2
4
Offset error  
Gain error  
C
= 10 µF (tantalum) and 100 nF (ceramic)  
VREF+  
(V  
− V  
/V  
)
(V  
eREF+  
− V  
/V  
),  
),  
eREF+  
REF− eREF− min  
REF− eREF−  
E
E
2.2 V/3 V  
2.2 V/3 V  
1.1  
2
2
5
LSB  
LSB  
G
C
= 10 µF (tantalum) and 100 nF (ceramic)  
VREF+  
(V  
− V  
/V  
)
(V  
eREF+  
− V  
/V  
Total unadjusted  
error  
eREF+  
REF− eREF− min  
REF− eREF−  
T
C
= 10 µF (tantalum) and 100 nF (ceramic)  
VREF+  
37  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
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